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Jsm 7500f scanning electron microscope

Manufactured by JEOL
Sourced in Japan, United States, Germany

The JSM-7500F is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution images of small-scale specimens. The JSM-7500F uses a field emission gun (FEG) as the electron source, which enables it to achieve high-resolution imaging capabilities. The microscope is equipped with various detectors, including a secondary electron detector and a backscattered electron detector, to capture different types of signals from the specimen.

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33 protocols using jsm 7500f scanning electron microscope

1

Comprehensive Characterization of Materials

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The fluorescence spectra were obtained on a Hitachi Model FL-4500 fluorescence spectrometer using a quartz cell with a 1 cm path length at room temperature. The UV-vis absorption spectrum was recorded by a UV-3600 visible spectrophotometer (Shimadzu, Japan) at room temperature. A Rigaku Smart Lab diffractometer (Rigaku, Japan) was utilized to record powder X-ray diffraction spectrometry (PXRD) patterns with a 2θ range from 2–30° and monochromated Cu Kα radiation (λ = 1.5418 Å). A JSM-7500F scanning electron microscope (SEM) (JEOL, Japan) was used to obtain the morphology of the materials. Thermogravimetric analyses (TGA) were performed by a TG 8121 analyzer at heating rate of 15 °C min−1 from room temperature to 700 °C (Rigaku, Japan). A MAGNA-IR 560 spectrometer (Nicolet, USA) was used to recorded Fourier-transform infrared (FT-IR) spectrum in the range 3000–400 cm−1 with KBr tablet method. The mass spectral was recorded by 6520 Q-TOF LC/MS (Agilent, USA). An ICS-1100 ion chromatograph (IC) was used to measure anions in seawater, which equipped with Dionex IonPac™ AS14 column (Thermo, USA). The measurement of Eu3+ and mental ions in sea water was carried out on a Spectro Blue inductively coupled plasma-optical emission spectroscopy (ICP-OES) (Spectro, Germany).
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2

Comprehensive Physico-Chemical Characterization

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FT-IR spectra were recorded in the range of 4000–400 cm−1 with a resolution of 2 cm−1 by a Nicolet Is10 Fourier transform infrared spectrometer (FT-IR) (Thermo Fisher Scientific, USA) using the potassium bromide particle method. The samples were analyzed in the range of 5° to 90° using an X-ray diffraction analyzer of the EMPYREAN model (PANalytical B.V., Netherland). Surface morphology of the samples was observed using a JSM7500F scanning electron microscope (SEM) (JEOL, Japan). The elemental composition of the samples was measured by 51-XMX0019X-Max energy-dispersive X-ray spectroscopy (EDXS) (Oxford Instruments, UK). The zeta potential of the sample was detected with a Zetasizer Nano ZSP (Malvern, UK), the concentration of the prepared suspension is 0.5 mg mL−1, and the pH of the suspension was adjusted with 0.01 M sodium hydroxide or hydrochloric acid solution.
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3

Characterizing Reduced Graphene Oxide Films

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Sheet resistance: Rs, of VC-rGO films was measured with a Loresta-AX MCP-T370 handheld low resistivity four-point probe (Nittoseiko Analytech Co., Ltd.). Profilometry was performed with a Tencor KLA P-7 Stylus Profiler (KLA Corp.; scan speed = 50 μm s−1; sampling frequency, fs = 200 Hz; stylus applied force, fappl = 2 mg) to determine VC-rGO film thickness, τ. After measuring the values of sheet resistance and average thickness, the DC conductivity of the films, σDC, was calculated using the relationship σDC = (Rs·τ)−1.
Raman: spectra were collected using an NT-MDT Ntegra Raman-NSOM system, with a 532 nm excitation laser. The effective wavelength range was limited to 180–2,580 cm−1. Raman spectra were averaged across N = 6 separate scans, and then fitted with a Lorentzian function in MATLAB to determine peak positions and intensities for the peaks specific to graphitic carbon (i.e., the D and G bands).
Imaging: a JSM-7500F scanning electron microscope (SEM; JEOL, Ltd.) with a 3 keV accelerating voltage was used for imaging VC-rGO thin films on glass substrates. A Bruker Icon atomic force microscope (AFM; Bruker Corp.) was used to characterize the flake morphology of GO + VC and VC-rGO thin films on glass substrates, and ImageJ was used to help identify individual flakes in the collected micrographs.
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4

Comprehensive Material Characterization Protocol

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All chemicals were obtained
commercially and used as received without further purification. The
aqueous suspensions used in fluorescence measurements were prepared
with ultrapure water.
PXRD patterns were recorded on a Rigaku
D/Max-2500 diffractometer with Cu Kα radiation (λ = 0.15406
nm) and samples were scanned at 60 kV and 300 mA. Elemental compositions
(C, H, and N) of samples were measured by using a PerkinElmer 240C
analyzer. Thermogravimetric analysis (TGA) was carried out using a
Rigaku standard TG-DTA analyzer from ambient temperature to 700 °C
with a heating rate of 10 °C min–1 in the air,
and an empty Al2O3 crucible was used as the
reference. SEM images were taken by using a JEOL JSM-7500F scanning
electron microscope. Steady state fluorescence experiments were carried
out on an Agilent G9800A fluorescence spectrometer, and an SPVF-1X0
accessory was used to control the sample temperature at 25 °C.
A Rikakikai NTT-2200P accessory was used to control the temperature.
Absorption spectra were recorded by using a Shimadzu UV-2450 spectrophotometer.
Zeta potential was measured using a ZETAPALS/BI-200SM analyzer.
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5

Comprehensive Characterization of Fluorescent MoS2

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The UV-vis spectra of the FL-MoS2 suspensions were recorded on a UV-1800PC spectrometer (Shanghai Mapada), and a quartz cell with a path length of 1.0 cm was used as the sample pool. The SEM images were obtained using a JEOL JSM-7500F scanning electron microscope, with an Au film coating (20 mA for 50 s) before SEM observation. The TEM images were measured using a field-emission transmission electron microscope (JEOL, JEM-2100) with an accelerating voltage of 200 kV. The Raman spectra were obtained using a Raman spectrometer (LabRAM HR Evolution, HORIBA JobinYvon, France) at 525 nm, and the powder samples were prepared on a SiO2/Si substrate. The X-ray diffraction (XRD) patterns were recorded on an XD-3 X-ray diffractometer (Beijing Purkinje General Instrument Co., Ltd., China) with a Cu Kα irradiation (λ = 0.15406 nm). The Fourier transformed infrared (FT-IR) spectra were recorded on a Bruker-Equinox 55 spectrometer in a transmittance mode in a wavenumber range of 4000 to 400 cm−1. The atomic force microscopy (AFM) measurement was performed on a Bruker NanoScope V instrument in a tapping mode. The N2 adsorption-desorption isotherms were obtained on a Surface Area and Porosity Analyzer (ASAP 2460, Micromeritics).
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6

Comprehensive Characterization of Graphene Aerogel

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The morphology of the GA-GH and GH was examined by field-emission scanning electron microscopy (FESEM) on a JSM-7500F scanning electron microscope (JEOL Ltd., Tokyo, Japan). The chemical states of the element on the graphene aerogel surface were investigated by X-ray photoelectron spectroscopy, (XPS) using an XSAM 800 photoelectron spectroscope (Kratos Analytical, Ltd, Manchester, U.K.). X-ray diffraction (XRD) spectra were recorded on a D/max-2200/PC X-ray diffractometer (Rigaku Corporation, Tokyo, Japan) with Cu Kα radiation. Thermogravimetric analysis (TGA) was performed using a TG209F1 Libra Thermogravimetric Analyzer (Netzsch NETZSCH Group, GmbH, Selb, Germany), from room temperature to 750 °C at a heating rate of 20 °C min−1 in air. The concentration of Cr(iii) was determined by ICP-OES, using an Optima 2100DV spectrometer (PerkinElmer, Waltham, MA, USA). UV-vis diffuse reflectance spectra (UV-vis DRS) were recorded using a UV-3600 UV-vis-NIR spectrophotometer (Shimadzu, Kyoto, Japan) equipped with an integrating sphere and using BaSO4 as reference. The specific surface areas of GA-GH and GH were calculated by the Brunauer–Emmett–Teller (BET) method.
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7

Co-Based Alloy Cladding on EH40 Steel

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The substrate material used in the experiment was EH40 high-strength low-temperature steel, obtained from China Baowu Steel Group Corporation. The chemical compositions (wt.%) of EH40 steel were 0.16 C, 0.15 Si, 0.90 Mn, 0.10 V, 0.20 Cr, 0.02 Nb, 0.020 Al, 0.08 Mo, 0.35 Cu, 0.40 Ni, 0.02 Ti, and Fe balance. The EH40 steel was in the normalized condition and consisted mainly of polygonal ferrite (PF) and pearlite (P) structures. Prior to the cladding process, the surface of the EH40 steel was ground using 80# sandpaper to remove rust layers. Macroscopic morphology and metallographic structure of EH40 substrate steel are shown in Figure 1.
Co-based alloy powder (Höganäs, Shanghai, China) with the elemental composition (wt.%) of 1.4 C, 7.7 W, 0.2 Ni, 0.2 Fe, 27.6 Cr, 1 Si, and Co balance was used as the binder phase for the composite coatings. The micromorphology of the Co-based powder was observed using JEOL JSM-7500F scanning electron microscope (SEM, JEOL, Tokyo, Japan), and the powder phase compositions were examined by PANalytical X’Pert PRO X-ray diffractometer (XRD, PANalytical B.V., Almelo, The Netherlands) with a Cu-Kα radiation over a 2θ range of 20°–80°. The results of SEM and XRD are shown in Figure 2. Figure 2a shows that the powder has uniform particle size and good sphericity, ensuring smooth flow during the cladding process.
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8

Co-Based Alloy Cladding on EH40 Steel

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The substrate material used in the experiment was EH40 high-strength low-temperature steel, obtained from China Baowu Steel Group Corporation. The chemical compositions (wt.%) of EH40 steel were 0.16 C, 0.15 Si, 0.90 Mn, 0.10 V, 0.20 Cr, 0.02 Nb, 0.020 Al, 0.08 Mo, 0.35 Cu, 0.40 Ni, 0.02 Ti, and Fe balance. The EH40 steel was in the normalized condition and consisted mainly of polygonal ferrite (PF) and pearlite (P) structures. Prior to the cladding process, the surface of the EH40 steel was ground using 80# sandpaper to remove rust layers. Macroscopic morphology and metallographic structure of EH40 substrate steel are shown in Figure 1.
Co-based alloy powder (Höganäs, Shanghai, China) with the elemental composition (wt.%) of 1.4 C, 7.7 W, 0.2 Ni, 0.2 Fe, 27.6 Cr, 1 Si, and Co balance was used as the binder phase for the composite coatings. The micromorphology of the Co-based powder was observed using JEOL JSM-7500F scanning electron microscope (SEM, JEOL, Tokyo, Japan), and the powder phase compositions were examined by PANalytical X’Pert PRO X-ray diffractometer (XRD, PANalytical B.V., Almelo, The Netherlands) with a Cu-Kα radiation over a 2θ range of 20°–80°. The results of SEM and XRD are shown in Figure 2. Figure 2a shows that the powder has uniform particle size and good sphericity, ensuring smooth flow during the cladding process.
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9

Microscopic Characterization of Swollen CMCG

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SEM images of the cross-sectional surfaces of the swollen CMCG specimens were obtained following sample preparation as follows. After swelling in PBS at 298 K for 24 h, each CMCG was carefully cut using a razor blade, frozen at −70 °C, and freeze-dried under vacuum. The freeze-dried samples were fixed on specimen stubs that had been sputter-coated with a layer of platinum (4 nm thickness) prior to observation. The SEM images were obtained using a JEOL JSM-7500F scanning electron microscope (JEOL Ltd., Akishima, Japan) at an acceleration voltage of 5.0 kV.
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10

Ultrastructural Analysis of PPP Scaffolds

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Example 11

In order to evaluate the ultra-structural analysis, at different time points, Scanning Electron Microscopy (SEM) was used to investigate the structure, morphology of the PPP scaffolds with or without cells. The 5 mm punches of PPP scaffolds described previously were fixed with 2.5% gluteraldehyde (Sigma, USA), dehydrated in a progressive series of ethanol before being mounted on an aluminum stub using silver paint. Samples were coated with gold/palladium before examination under a JSM-7500F scanning electron microscope (JEOL, USA).

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