Jsm 7500f scanning electron microscope
The JSM-7500F is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution images of small-scale specimens. The JSM-7500F uses a field emission gun (FEG) as the electron source, which enables it to achieve high-resolution imaging capabilities. The microscope is equipped with various detectors, including a secondary electron detector and a backscattered electron detector, to capture different types of signals from the specimen.
Lab products found in correlation
33 protocols using jsm 7500f scanning electron microscope
Comprehensive Characterization of Materials
Comprehensive Physico-Chemical Characterization
Characterizing Reduced Graphene Oxide Films
Raman: spectra were collected using an NT-MDT Ntegra Raman-NSOM system, with a 532 nm excitation laser. The effective wavelength range was limited to 180–2,580 cm−1. Raman spectra were averaged across N = 6 separate scans, and then fitted with a Lorentzian function in MATLAB to determine peak positions and intensities for the peaks specific to graphitic carbon (i.e., the D and G bands).
Imaging: a JSM-7500F scanning electron microscope (SEM; JEOL, Ltd.) with a 3 keV accelerating voltage was used for imaging VC-rGO thin films on glass substrates. A Bruker Icon atomic force microscope (AFM; Bruker Corp.) was used to characterize the flake morphology of GO + VC and VC-rGO thin films on glass substrates, and ImageJ was used to help identify individual flakes in the collected micrographs.
Comprehensive Material Characterization Protocol
commercially and used as received without further purification. The
aqueous suspensions used in fluorescence measurements were prepared
with ultrapure water.
PXRD patterns were recorded on a Rigaku
D/Max-2500 diffractometer with Cu Kα radiation (λ = 0.15406
nm) and samples were scanned at 60 kV and 300 mA. Elemental compositions
(C, H, and N) of samples were measured by using a PerkinElmer 240C
analyzer. Thermogravimetric analysis (TGA) was carried out using a
Rigaku standard TG-DTA analyzer from ambient temperature to 700 °C
with a heating rate of 10 °C min–1 in the air,
and an empty Al2O3 crucible was used as the
reference. SEM images were taken by using a JEOL JSM-7500F scanning
electron microscope. Steady state fluorescence experiments were carried
out on an Agilent G9800A fluorescence spectrometer, and an SPVF-1X0
accessory was used to control the sample temperature at 25 °C.
A Rikakikai NTT-2200P accessory was used to control the temperature.
Absorption spectra were recorded by using a Shimadzu UV-2450 spectrophotometer.
Zeta potential was measured using a ZETAPALS/BI-200SM analyzer.
Comprehensive Characterization of Fluorescent MoS2
Comprehensive Characterization of Graphene Aerogel
Co-Based Alloy Cladding on EH40 Steel
Co-based alloy powder (Höganäs, Shanghai, China) with the elemental composition (wt.%) of 1.4 C, 7.7 W, 0.2 Ni, 0.2 Fe, 27.6 Cr, 1 Si, and Co balance was used as the binder phase for the composite coatings. The micromorphology of the Co-based powder was observed using JEOL JSM-7500F scanning electron microscope (SEM, JEOL, Tokyo, Japan), and the powder phase compositions were examined by PANalytical X’Pert PRO X-ray diffractometer (XRD, PANalytical B.V., Almelo, The Netherlands) with a Cu-Kα radiation over a 2θ range of 20°–80°. The results of SEM and XRD are shown in
Co-Based Alloy Cladding on EH40 Steel
Co-based alloy powder (Höganäs, Shanghai, China) with the elemental composition (wt.%) of 1.4 C, 7.7 W, 0.2 Ni, 0.2 Fe, 27.6 Cr, 1 Si, and Co balance was used as the binder phase for the composite coatings. The micromorphology of the Co-based powder was observed using JEOL JSM-7500F scanning electron microscope (SEM, JEOL, Tokyo, Japan), and the powder phase compositions were examined by PANalytical X’Pert PRO X-ray diffractometer (XRD, PANalytical B.V., Almelo, The Netherlands) with a Cu-Kα radiation over a 2θ range of 20°–80°. The results of SEM and XRD are shown in
Microscopic Characterization of Swollen CMCG
Ultrastructural Analysis of PPP Scaffolds
Example 11
In order to evaluate the ultra-structural analysis, at different time points, Scanning Electron Microscopy (SEM) was used to investigate the structure, morphology of the PPP scaffolds with or without cells. The 5 mm punches of PPP scaffolds described previously were fixed with 2.5% gluteraldehyde (Sigma, USA), dehydrated in a progressive series of ethanol before being mounted on an aluminum stub using silver paint. Samples were coated with gold/palladium before examination under a JSM-7500F scanning electron microscope (JEOL, USA).
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