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Sigma 300 vp fesem

Manufactured by Zeiss
Sourced in Germany

The Sigma 300 VP-FESEM is a field emission scanning electron microscope (FESEM) manufactured by Zeiss. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The Sigma 300 VP-FESEM features a variable pressure mode, allowing for the examination of uncoated and non-conductive samples without the need for additional sample preparation.

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9 protocols using sigma 300 vp fesem

1

Scanning Electron Microscopy of Tensile Fracture Surfaces

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The morphology of the failure surface of the tensile tested samples was observed using a field emission scanning electron microscope (FE-SEM) (Zeiss Sigma 300 VP-FESEM, Zeiss, Cambridge, UK). Cross-sectional samples were cut from the fractured surfaces of the dog-bone samples after tensile testing was completed. To reduce surface charging during SEM imaging, a thin film of carbon was deposited onto the samples using a carbon evaporation system (EM SCD 005, Leica Baltec Instruments, Balzers, Liechtenstein). The images were captured using secondary electron (SE) mode with a voltage of 5.00 kV.
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2

Hydrogel Pore Structure Analysis

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The porous structure of the hydrogels was observed by scanning electron microscopy (SEM) (Zeiss Sigma 300 VP FE-SEM, Carl Zeiss AG, Oberkochen, Germany). After 2 h of incubation at 37 °C, samples were frozen for at least 2 h at −20 °C and then freeze dried overnight. Samples were sectioned, gold sputtered and then observed under an SEM microscope at different magnifications. Finally, the measurement of the hydrogel pore diameter was statistically evaluated using ImageJ software (ImageJ bundled with 64-bit Java 1.8.0_172, NIH). Five SEM images (magnification 5×) were analyzed for Ch-Pec-βGP, Ch-Pec-PB and Ch-Pec-SHC samples, measuring the diameter as an average of two measurements for each pore, with a total of approximately 250 pores per sample.
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3

SEM Imaging of Polished Dental Crowns

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The treated crowns including the new and worn polishers, were mounted on aluminum stubs using double‐sided carbon tape and carbon paste, and coated with 15 nm of gold palladium (Quorum Q150V Plus modular coating system, Quorum Technologies Limited). The SEM images were captured using a Zeiss Sigma 300VP FESEM (Carl Zeiss Inc) at an accelerating voltage of 5 KV.
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4

Struvite Characterization from Wastewater

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The PO4–P concentration in the solution was measured by Hach methods (TNT844, Hach, USA) before and after the reaction. To measure TSS, water samples were filtered through a 0.45 μm pre-weighted filter. The filter was dried in an oven at 105 °C until the weight of the filter no longer changed and the increase in filter weight representing the mass of the TSS was used to calculate the TSS concentration. The precipitate was analyzed via X-ray diffraction (XRD; Rigaku Ultimate IV, Japan) and scanning electron microscopy (SEM; Zeiss Sigma 300 VP-FESEM, USA) configured with energy dispersive X-ray spectroscopy (EDS; Bruker EDS System, USA). The peaks of the XRD spectra were compared to the Inorganic Crystal Structure Database (ICSD) for struvite confirmation using the reference card PDF #97-006-0626.
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5

Comprehensive Catalyst Characterization

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The phase of the catalyst was analyzed by powder X-Ray diffraction (XRD) using a Rigaka D/max-2500 X-ray diffractometer with a Cu Kα radiation at room temperature and the data were analyzed with Jade and Xpert Highscore Plus Software. The microstructure and morphology of the catalysts, cross sectional and surface images of the cells as well as the material composition by SEM-EDS analysis were obtained at room temperature by Zeiss Sigma 300VP-FESEM equipment. Thermogravimetric (TGA) Analysis of the materials was performed using a Q600 (TA instrument) instrument in different atmospheres. The temperature program oxidation (TPO) was carried out using a TG-Mass Spectrometry (thermostat QMS 200) instruments (TG-MS). The hydrogen-temperature program reduction (H2-TPR) analysis was performed using a home-made temperature program setup equipped with a Hewlett Packard 5,890 Series Ⅱ gas chromatograph. The X-ray photoelectron spectra were collected on a Thermo fisher Scientific K-Alpha+ instrument. The C1s XPS peak was calibrated to 284.6 eV, as shown in Supplementary Figure S2.
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6

Elemental Analysis of Dentin Surfaces

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An Oxford X max 50 EDX spectroscopy system with dual silicon drift detectors, each with an area of 50 mm
2, and a resolution of 125eV (Zeiss Sigma 300 VP-FESEM, Oberkochen, Germany) were used to measure the relative amounts of calcium, phosphorus, carbon, oxygen, sodium, and magnesium on dentin surfaces after treatment. EDX analysis was performed on each sample at the middle and apical regions. A mean value of the atomic percentage of each of the six elements that were measured across the root canal was calculated for the middle and apical regions.
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7

Scanning Electron Microscopy Analysis of Root Canal Cleanliness

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The samples were observed under a field emission scanning electron microscope (Zeiss Sigma 300 VP-FESEM; Oberkochen, Germany). A low-magnification (x50) was used to delineate two regions of interest, extending from 0 to 5 mm from the apex (apical) and from 5 to 10 mm (middle). The coronal portion of the root was excluded from evaluation because, independently of the irrigation protocol used, this region is easily cleaned.
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For both regions, two microphotographs were taken (x350 and x1000) and evaluated by two calibrated observers, who blindly assessed the cleanliness of the canal using the Hulsmann score.
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In case of disagreement, the worst score was selected for calculations.
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8

Morphology Analysis of Extracellular Vesicles

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The morphology analysis of GEVs and TEVs was carried out by AFM [17 (link)]. Briefly, samples of each PEV suspension in PBS were 50-fold diluted with Milli-Q water, and 5 µL aliquots (about 107 particles) were deposited onto freshly mica nanochips (TipsNano, SPM, Tallinn, Estonia). After drying completely at room temperature, the mica surface was flooded with Milli-Q water to dissolve the salt. The remaining water was removed by drying the nanochips for a 2-h incubation at 37 °C (or 24 h at room temperature). The sample topography measurements were performed in semi-contact mode using the atomic force microscope “NT-MDT-Smena B” with an NSG03 probe (NT-MDT, Moscow, Russia).
The visualization of GEVs and TEVs was also conducted by SEM. Briefly, samples in PBS were diluted 10-fold with Milli-Q water, and 100 μL aliquots were deposited onto coverslips. Then, samples were fixed with 2.5% glutaraldehyde, washed three times with 0.05% PBS, and dehydrated progressively with 30, 50, 70, 80, 90, and 100% ethanol. Samples were subjected directly to a FESEM system (Sigma 300 VP FESEM, Carl Zeiss, Jena, Germany) for morphology visualization without coating.
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9

Structural Analysis of Bioprinted Constructs

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Scanning electron microscopey (SEM., Zeiss Sigma 300 VP-FESEM) was used to observe the TCNF fibre diameter and the ECM formation of the bioprinted constructs after 6 weeks of in vitro culture. Each construct was fixed in sodium cacodylate trihydrate buffer containing 2% v/v glutaraldehyde and 2.5% v/v paraformaldehyde overnight. The samples were then cut in half and washed twice with deionized water to wash away the fixation solution. The samples were further treated with osmium tetroxide and tannic acid before SEM observation. All the reagents were purchased from Electron Microscopy Sciences (Pennsylvania, United States).
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