The crystalline nature of the AuNPs loaded with NAT and Doxorubicin was evaluated utilizing a Brucker D8 advance X-ray Diffractometer with a copper cell. To detect the crystalline condition of the nanocomposites, the liquid samples were cast onto a microscopic slide that was cut into 1.5*1.5 cm dimensions, dried, and 2θ values were recorded in an XRD fitted with a Cu anode filter, and a 40kV/30mA D8 diffractometer.
D8 advance x ray diffractometer
Manufactured by Brucker
Sourced in United Kingdom
The D8 Advance X-ray diffractometer is a versatile laboratory instrument used for the analysis of crystalline materials. It employs X-ray diffraction techniques to provide information about the structure, composition, and properties of various samples. The core function of the D8 Advance is to accurately measure and analyze the diffraction patterns produced by the interaction of X-rays with the atoms in the sample, enabling the identification and characterization of the material under investigation.
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5 protocols using d8 advance x ray diffractometer
1
Crystalline Analysis of AuNP Nanocomposites
2
Analytical Characterization of Liquid Products
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The samples of liquid products were analyzed by EX1600SM High Pressure Liquid Chromatography with C18 column and detection wavelength of UV254 nm under the conditions: room temperature, methanol solvent, mobile phase of acetonitrile/water at 1 : 1 volume ratio and potassium dihydrogen phosphate (0.5%) at flow rate of 1.000 mL min−1. The content of each component was evaluated by corresponding calibration factor. Identification of reaction intermediates were conducted with Agilent 6520 Q-TOF LC/MS, and 1H NMR spectra were generated by Brucker Avance 400 NMR using CDCl3 as solvent and TMS as internal standard.
The textural properties of catalyst were analyzed by BET method using a ASAP 2020 V3.01 H analyzer of Micromeritics Co., USA, and the acidic properties were measured by NH3 temperature programmed desorption (TPD) technique. The NH3-TPD tests were carried out in an AutochemII2920 high performance automatic chemical adsorption instrument of McMertek Instruments Co., Ltd., USA with helium as carrier gas, and a thermal conductivity detector (TCD) was used for the detection of the evolved gas. Thermogravimetry and differential thermal analysis (TG-DTA) of the samples was conducted on a NETZSCH STA449 analyzer and XRD analysis was conducted on a Brucker D8 Advance X-ray diffractometer.
The textural properties of catalyst were analyzed by BET method using a ASAP 2020 V3.01 H analyzer of Micromeritics Co., USA, and the acidic properties were measured by NH3 temperature programmed desorption (TPD) technique. The NH3-TPD tests were carried out in an AutochemII2920 high performance automatic chemical adsorption instrument of McMertek Instruments Co., Ltd., USA with helium as carrier gas, and a thermal conductivity detector (TCD) was used for the detection of the evolved gas. Thermogravimetry and differential thermal analysis (TG-DTA) of the samples was conducted on a NETZSCH STA449 analyzer and XRD analysis was conducted on a Brucker D8 Advance X-ray diffractometer.
3
Characterization of Coatings on Ti6Al4V Implants
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Energy dispersive X-ray spectroscopy (EDS) was used to analyse the composition of the coatings on the Ti6Al4V implants (EDX, EDAX Inc, USA). The crystal structures of the coatings were analysed using X-ray diffractometry (XRD), on a Bruker D8 Advance X-ray diffractometer (Brucker, UK). Cu-Kα radiation at a 2θ range of 0–100° was used. The phases present were identified by comparing the obtained diffraction patterns with the International Committee for Diffraction Data (ICDD) file cards 9–432 for HA.
4
Characterization of Cobalt Nanoparticles
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The sizes and morphologies of CoNPs were determined using a Tecnai G2 (link)F30 transmission electron microscope (TEM) under 300 kV accelerating. Samples of the CoNPs were dispersed in cyclohexane, dropping on the surface of a copper grid. High-resolution lattice image was also obtained during the TEM determination. Powder X-ray diffraction (XRD) measurement was carried out using a Brucker D8 advance X-ray diffractometer from 10° to 90° (Cu Kα radiation, λ=1.54 Å). Ultraviolet-visible-near infrared (UV-vis-NIR) absorption spectra were obtained on a Shimadzu UV-3600 ultraviolet-visible-near-infrared spectrophotometer. Fluorescence spectra were carried out on Hitachi F-7000 fluorescence spectrophotometer. Dynamic light scattering and zeta potential experiments were carried out on an ALV-5000 spectrometer goniometer equipped with an ALV/LSE-5004 light scattering electronic and multiple tau digital correlator and a JDS Uniphase He-Ne laser (632.8 nm) with an output power of 22 mW. The size distribution was measured at 25°C with a detection angle of 90°. Inductively coupled plasma mass spectroscopy (ICP-MS) analysis was performed on Agilent 7500ce ICP-MS.
5
X-ray Powder Diffraction Analysis
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The samples are characterized by X-ray powder diffractometer (XRD) through using a Brucker D8-advance X-ray Diffractometer with Cu K α radiation (λ = 1.5418 Å); the operation voltage and current are, respectively, 40 kV and 40 mA. The 2θ range scan is swept from 10° to 70° in 0.02° steps with a count time of 0.2 s.
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