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Aluminum sem stubs

Manufactured by Ted Pella
Sourced in United States

Aluminum SEM stubs are cylindrical mounts used to hold and support samples for examination in a scanning electron microscope (SEM). They provide a stable platform to securely affix specimens during the imaging process.

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7 protocols using aluminum sem stubs

1

Morphological Analysis of Lactomorphin and Trehalose Powders

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Using similar conditions as previously reported [18 (link),19 (link),21 (link),24 (link),25 (link),26 ,27 (link)], scanning electron microscopy (SEM) of the Lactomorphin and Trehalose (as supplied by the manufacturer), SD, and co-SD powders were evaluated. Visual imaging, analysis of particle size, morphology, and surface morphology were achieved by (SEM). Powder samples were attached to aluminum SEM stubs (Ted-Pella, Inc., Redding, CA, USA) using double-sided carbon conductive adhesive Pelco tabs (TedPella, Inc., Redding, CA, USA). Subsequently, the powder sample in the stub was sputter-coated with a 7 nm thin film of gold using Anatech Hummer 6.2 (Union City, CA, USA) system at 20 μA for 90 s under an argon plasma. SEM images of the powder sample were collected using a FEI Inspect S (FEI, Hillsboro, OR, USA). Images were collected using a tungsten source at 30 kV with a working distance of 10–10.4 mm. SEM images were captured at several different magnification levels.
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2

SEM Imaging of Fiber Scaffolds

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Prior to SEM, fiber scaffolds were mounted on aluminum SEM stubs (Ted Pella) with conductive carbon tape (Ted Pella) and sputter coated with a 0.5 nm Au/Pd coating using a Hummer Technics V sputter coater (Anatech Ltd.). Fiber samples were then imaged using a FEI Versa 3D DualBeam SEM with a low accelerating voltage (2–10 kV) to avoid melting the fibers.
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3

SEM Imaging of Nanoparticle Morphology

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Nanoparticle size and surface morphology was visualized using SEM (FEI Inspect S SEM, FEI Company, Hillsboro, OR, USA). Powders were deposited on double-sided carbon conductive adhesive tabs (Ted-Pella, Inc., Redding, CA, USA) attached to aluminum SEM stubs (Ted-Pella, Inc., Redding, CA, USA) and sputter-coated (Anatech Hummer 6.2, Union City, CA, USA) with gold for 90 s under argon plasma as previously reported [39 (link)].
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4

Nanoparticle and Microparticle Morphology Analysis

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The shape and surface morphology of the nCmP and MP were evaluated by SEM using a Zeiss SIGMA VP Field Emission-Scanning Electron Microscope (FE-SEM) (Germany). Particle samples were placed on aluminum SEM stubs (Ted Pella, Inc., Redding, CA) with double-sided adhesive carbon tabs. The samples were coated with a thin film of a gold/palladium alloy using a BIO-RAD sputter coating system at 20 µA for 60 seconds under argon gas. Images were captured at 8 kV at various magnifications. The geometric mean diameter and standard deviation of the MP were measured digitally from SEM images using ImageJ software (Rasband, 1997–2016 ). Representative micrographs (5000× magnification) for each sample were analyzed by measuring the diameter of at least 300 particles.
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5

Comprehensive Powder Characterization by SEM

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SEM of raw Ang (1—7), raw PNA5, and Trehalose (as supplied by the manufacturer), SD Ang (1—7), SD PNA5, SD Trehalose, co-SD Ang (1—7):Trehalose (25:75) and co-SD PNA5:Trehalose (25:75) powders were evaluated using same conditions reported in [24 (link)]. Visual imaging, analysis of particle size, morphology, and surface morphology were achieved by (SEM). Powder samples were attached to aluminum SEM stubs (Ted-Pella, Inc., Redding, CA, USA) using double-sided carbon conductive adhesive Pelco tabs™ (Ted Pella, Inc. Redding, CA, USA). Then, using Anatech Hummer 6.2 (Union City, CA, USA) system, each sample in the stub was sputter-coated with a 7 nm thin film of gold at 20 μA for 90 s under an argon plasma. SEM images were captured at several different magnification levels. SEM images of the powder sample were collected using an FEI Inspect S (FEI, Hillsboro, OR, USA) and using a tungsten source at 30 kV with a working distance of 10 mm–10.4 mm.
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6

Scanning Electron Microscopy of Electrospun Fibers

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Electrospun fibers were imaged using SEM. Prior to SEM, coverslips with fibers were mounted onto aluminum SEM stubs (Ted Pella, Redding, CA) and sputter coated with a 1 nm layer of Gold/Palladium using a Technics V Sputter Coater (Anatech Ltd., Denver, CO). Fibers were then imaged at a low accelerating voltage (2–5 kV) using a FEI Versa 3D DualBeam SEM (Hillsboro, OR).
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7

Scanning Electron Microscopy of Nanoparticles

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The shape and surface morphology of the NP and nCmP were evaluated by SEM using a Hitachi S-4300 microscope (Tokyo, Japan). nCmP samples were placed on aluminum SEM stubs (TedPella, Inc., Redding, CA, USA) with double-sided adhesive carbon tabs. Nanoparticles were dispersed in basic water (pH = 9, 10 mg/mL) and this suspension was dropped onto aluminum SEM stubs and then dried at room temperature. Both the NP and nCmP samples were coated with a thin film of a gold/palladium alloy using an Emscope SC400 sputter coating system at 20 µA for 75 seconds under argon gas. Images were captured at 5 kV.
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