The surface morphology of the topographical substrates and flat substrates was investigated by scanning electron microscopy (SEM) (Hitachi Japan; apparatus working at 10 keV accelerating voltage), atomic force microscopy (AFM; DME DS 95 Navigator 220), and optical microscopy (Nikon Optiphot 200). Before SEM imaging, all samples were coated with a thin layer of gold using a sputtering machine. AFM contact mode was performed using a rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) with a spring constant of 2.8 N m−1 and a conical tip of 8 nm radius. The sample's surface up to 90 μm2 was scanned by a scan rate of 0.05 Hz and setpoint force 0.5 nN. The standard software of the instrument (JPKSPM Data Processing) was utilized for image analysis.
Ds 95 navigator 220
Manufactured by Nikon
Sourced in Japan
The DS 95 Navigator 220 is a laboratory equipment product manufactured by Nikon. It serves as a microscope that provides digital imaging capabilities for scientific and research applications. The core function of this device is to capture and display high-quality digital images of specimens under observation.
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Lab products found in correlation
2 protocols using ds 95 navigator 220
1
Surface Morphology Analysis of Topographical Substrates
2
Topographical Substrate Surface Characterization
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The surface morphology of the topographical substrates and flat substrates was investigated by scanning electron microscopy (SEM) (Hitachi Japan; apparatus working at 10 keV accelerating voltage), atomic force microscopy (AFM; DME DS 95Navigator 220) and optical microscopy (Nikon Optiphot 200). Before SEM imaging, all samples were coated with a thin layer of gold using a sputtering machine. AFM contact mode was performed using a rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) with a spring constant of 2.8 N/m and a conical tip of 8 nm radius. The surface of the sample up to 90 μm 2 was scanned by a scan rate of 0.05 Hz and setpoint force 0.5 nN. The standard software of the instrument (JPKSPM Data Processing) was utilized for image analysis.
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