A 0.5 mg graphene oxide precursor (GO) sample was placed in a 50 mL aqueous solution and then it was ultrasonically dispersed in a bath-type sonicator for 20 min. The zeta potential of the GO sample was then measured using a Malvern Zetasizer Nano-ZS particle analyzer. At first, no pH adjustment was performed while measuring the zeta potential. Afterward, the suspension pH was adjusted within the range 2.5–11.55, using 0.1 M NaOH or 0.1 M HCl. For each sample, triplicate data were collected to obtain the average zeta potential with standard deviation.
Sigma vp sem
The Sigma VP SEM is a versatile scanning electron microscope (SEM) designed for high-performance imaging and analysis of a wide range of samples. It features a variable pressure (VP) capability, allowing for the examination of non-conductive and hydrated specimens without the need for additional sample preparation. The Sigma VP SEM provides high-resolution imaging, advanced analytical capabilities, and user-friendly operation, making it a reliable tool for various applications.
Lab products found in correlation
37 protocols using sigma vp sem
Graphene Oxide Characterization via Multi-Technique Analysis
A 0.5 mg graphene oxide precursor (GO) sample was placed in a 50 mL aqueous solution and then it was ultrasonically dispersed in a bath-type sonicator for 20 min. The zeta potential of the GO sample was then measured using a Malvern Zetasizer Nano-ZS particle analyzer. At first, no pH adjustment was performed while measuring the zeta potential. Afterward, the suspension pH was adjusted within the range 2.5–11.55, using 0.1 M NaOH or 0.1 M HCl. For each sample, triplicate data were collected to obtain the average zeta potential with standard deviation.
Serial Blockface SEM Datasets
Sputter Coating and 3View SEM Imaging
SEM Imaging of Micro-Textured Silicon Surfaces
Integrated Light and 3D EM Imaging
Imaging Cross-Sections of Tensile Films
after the tensile test were imaged by scanning electron microscopy
(SEM). A conductive 4 nm-thick coating of Au/Pd was sputtered on the
samples, prior to their imaging with a Zeiss Sigma VP SEM at an operating
voltage of 2 kV. At least 10 images were taken for each sample, and
the most representative ones were selected.
Ultrastructure Analysis of Tactile Bristle Differentiation
Serial Block-Face Imaging of Pancreatic Islets
SBF SEM Imaging of HeLa Cells
Ultrastructural Analysis of Neural Cells
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