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Sigma vp sem

Manufactured by Zeiss
Sourced in Germany, United States

The Sigma VP SEM is a versatile scanning electron microscope (SEM) designed for high-performance imaging and analysis of a wide range of samples. It features a variable pressure (VP) capability, allowing for the examination of non-conductive and hydrated specimens without the need for additional sample preparation. The Sigma VP SEM provides high-resolution imaging, advanced analytical capabilities, and user-friendly operation, making it a reliable tool for various applications.

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37 protocols using sigma vp sem

1

Graphene Oxide Characterization via Multi-Technique Analysis

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Fourier transform infrared spectroscopy (FTIR) of membranes was performed in attenuated total reflectance (ATR) mode, with 4 cm−1 resolution and 256 scans using a Thermo Scientific Nicollet 6700 FTIR spectrometer. The GO was characterized by powder X-ray diffraction using a Bruker D2 Phaser Powder X-ray Diffractometer, equipped with a CuKα radiation source. The XRD patterns were collected in a two-theta range from 2 to 120°, with an increment of 0.150° and 6 s per step. The total collection time was about 80 min. The microstructure of the GO particles was characterized using field emission scanning electron microscopy (FESEM, Zeiss Sigma VP SEM).
A 0.5 mg graphene oxide precursor (GO) sample was placed in a 50 mL aqueous solution and then it was ultrasonically dispersed in a bath-type sonicator for 20 min. The zeta potential of the GO sample was then measured using a Malvern Zetasizer Nano-ZS particle analyzer. At first, no pH adjustment was performed while measuring the zeta potential. Afterward, the suspension pH was adjusted within the range 2.5–11.55, using 0.1 M NaOH or 0.1 M HCl. For each sample, triplicate data were collected to obtain the average zeta potential with standard deviation.
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2

Serial Blockface SEM Datasets

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Serial blockface scanning electron microscopy (SBF SEM) data was collected using a 3View2XP (Gatan, Pleasanton, CA) attached to a Sigma VP SEM (Zeiss, Cambridge). Flat embed vibratome slices were cut out and mounted on pins using conductive epoxy resin (Circuitworks CW2400). Each slice was trimmed using a glass knife to the smallest dimension in X and Y whilst retaining all the tissue, and the surface polished to reveal the tissue before sputter coating with a 2 nm layer of platinum, and loading in the 3View2XP. Two SBF SEM datasets were collected, both of which fully contained the fluorescence microscopy volume. Backscattered electron images were acquired using the 3VBSED detector at 8,1928,192 pixels with a dwell time of either 5 or 4 μs (10 nm reported pixel size for a horizontal frame width of 81.92 μm) and 50 nm slice thickness. The SEM was operated in variable pressure mode at a chamber pressure of either 10 or 5 pascals, with high current mode inactive. The 30 μm aperture was used, with an accelerating voltage of 2.5 kV. Dataset 1 comprised a total of 1,180 images, representing a depth of 59 μm, and volume of 395,942 μm3; dataset 2 comprised a total of 1,296 images, representing a depth of 64.8 μm, and volume of 434,865 μm3.
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3

Sputter Coating and 3View SEM Imaging

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Samples were sputter coated with a 10 nm layer of platinum (Q150S, Quorum Technologies) and loaded into a 3View2XP (Gatan, Pleasanton, CA) attached to a Sigma VP SEM (Zeiss) with focal charge compensation (FCC, Zeiss) and data was collected using a BSE detector (3View detector, Gatan). Imaging parameters for each stage of tactile bristle differentiation can be found in Supplementary Table 2. The morphology of the neuronal dendrite from bristles lacking the F-Cell was visualized in the genotype neur>spi/EGFKD and no obvious defects were detected in the neuron and surrounding sheath cell membrane relative to wild-type controls.
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4

SEM Imaging of Micro-Textured Silicon Surfaces

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The SEM imaging was done using Zeiss Sigma VP SEM at a low acceleration voltage (1.0 kV) with an in-lens detector. Before imaging, the samples were coated with gold–palladium (Au/Pd) coating with Leica EM ACE600 high-vacuum sputter coater in the following manner. The bSi A (Fig. 4A) and µB+bSi A sample (Fig. 5B) was coated with 5 nm Au/Pd from the top and 5 nm Au/Pd from the side, while samples bSi B–D were coated with 8 nm Au/Pd from the side. No conductive coating was applied on the samples µA+bSi and µB+bSi shown in SI Appendix, Fig. S7. The SEM imaging of micropillared samples µA and µB before the black silicon etching was done with 4.0 kV acceleration voltage with an SE2 detector, and no conductive coating was applied on these samples.
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5

Integrated Light and 3D EM Imaging

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The integrated light and 3D EM image stack was collected using the miniLM attached to a 3View2XP (Gatan, Abingdon) microtome in a Sigma VP SEM (Zeiss, Cambridge). The trimmed IRF block was attached to a specimen pin using conductive epoxy resin (Chemtronics CircuitWorks CW2400), with the cell layer aligned perpendicular to the direction of cutting. The laser power at the sample level was set to ∼2.5 mW and the exposure time set to 500 ms. The delay time until the motor was restarted at the miniLM imaging position was set to 1.5 s. The serial imaging run was set up and started using the 3View microtome control software Digital Micrograph (version 2.3, Gatan Inc.), and the miniLM control software was then started. BSE images were acquired at a resolution of 1024 × 2048 pixels (horizontal frame width of 257.14 µm; pixel size of 250 nm) using a 10 µs per pixel dwell time and 200 nm slice thickness. The SEM was operated at a chamber pressure of 5 Pa, with high current mode active, at an indicated magnification of 500. The 120 µm aperture was used, at an accelerating voltage of 1.4 kV. Fluorescence and electron images were collected sequentially from a total of 500 slices, representing an overall depth of 10 µm and total volume of 1,322,445 µm3. The cell layer, nominally 100 µm in width, comprised less than half of this volume (at approximately 514,290 µm3).
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6

Imaging Cross-Sections of Tensile Films

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Cross sections of the films
after the tensile test were imaged by scanning electron microscopy
(SEM). A conductive 4 nm-thick coating of Au/Pd was sputtered on the
samples, prior to their imaging with a Zeiss Sigma VP SEM at an operating
voltage of 2 kV. At least 10 images were taken for each sample, and
the most representative ones were selected.
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7

Ultrastructure Analysis of Tactile Bristle Differentiation

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Samples were sputter coated with a 10 nm layer of platinum (Q150S, Quorum Technologies) and loaded into a 3View2XP (Gatan) attached to a Sigma VP SEM (Zeiss) with focal charge compensation (FCC, Zeiss), and data were collected using a BSE detector (3View detector, Gatan). Imaging parameters for each stage of tactile bristle differentiation can be found in Supplementary Table 2. The morphology of the neuronal dendrite from bristles lacking the F-Cell was visualized in the genotype neur > spi/EGFKD, and no obvious defects were detected in the neuron and surrounding sheath cell membrane relative to wild-type controls.
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8

Serial Block-Face Imaging of Pancreatic Islets

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The resin-embedded, gold-coated blocks were imaged using a Gatan 3View serial block-face imaging system mounted in the specimen chamber of a Zeiss SIGMA-VP SEM. A total of five blocks (one islet in each), taken from three wild-type mice, were imaged to collect the data used in this study. The microscope was operated at high vacuum, with accelerating voltage ranging from 1.3-1.5 kV, using a 30 μm condenser aperture. Images were collected at an intermediate magnification, with a pixel size of 11.1 nm and a dwell time of 2.0 μs/pixel. The size of each image collected was 4,000 x 4,000 pixels in the x-y plane. The thickness of each slice in z-direction was 50 nm. Data sets were collected as stacks of 500 images, resulting in data volumes of 4.93 x 104 μm3. The 3D image stacks were aligned using Digital Micrograph software (Gatan Inc., USA). Visualization and analysis of the data were performed using Digital Micrograph and Amira (FEI Inc., U.S.A.), as well as the NIH ImageJ software (Schneider et al., 2012 ).
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9

SBF SEM Imaging of HeLa Cells

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HeLa cells were prepared for SBF SEM following the method of the National Centre for Microscopy and Imaging Research (NCMIR) [51 ]. SBF SEM data were collected using a 3View2XP (Gatan, Pleasanton, CA) attached to a Sigma VP SEM (Zeiss, Cambridge). In total, 517 images of 8192 × 8192 pixels were acquired. Voxel size was 10 × 10 × 50 nm with intensity [0—255] (Figure 1). Initially, the data were acquired at higher bit-depth (32 bit or 16 bit) and, after contrast/histogram adjustment, reduced to 8 bit. For this paper, seven individual cells were manually cropped as volumes of interest. For each cell, the centroid was manually selected as the centre of a sub-volume of 300 slices with dimensions (nh, nw, nd) = (2000, 2000, 1) and were saved as single channel TIFF files. Images are openly accessible via the EMPAIR public image database (http://dx.doi.org/10.6019/EMPIAR-10094).
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10

Ultrastructural Analysis of Neural Cells

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Blocks from each group were trimmed and mounted on aluminium rivets with conductive glue (Chemtronics, Kennesaw, GA, USA). The surfaces of the trimmed samples were sputtered with gold to increase the conductivity and then imaged under various imaging conditions in a MERLIN or SIGMA/VP SEM instrument (Carl Zeiss Microscopy, Jena, Germany) equipped with a 3View in-chamber ultramicrotome (Gatan Inc., Pleasanton, CA, USA). Imaging in the MERLIN instrument was performed under a constant probe current (150 pA) and in the crossover-free mode. Imaging in the Sigma instrument was performed using a 30-μm aperture. The serial images obtained were processed with ImageJ and Fiji plugins (https://fiji.sc/wiki/index.php/Fiji), and segmentation and image analyses were performed in TrakEM251 (link), Amira version 5.6 (FEI Visualisation Science Group, Hillsboro, OR, USA), and Microscopy Image Browser (https://mib.helsinki.fi/), as shown in Fig. 2. Axons, synaptic vesicles, mitochondria, and lysosomes were semi-automatically and manually traced using these software packages.
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