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1

Temperature-dependent Single-crystal X-ray Diffraction

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Single-crystal X-ray diffraction data used to characterize unit-cell changes of 1a with temperature were collected on an Agilent SuperNova single-source diffractometer (Mo radiation, λ = 0.71073 Å). A single crystal of 1a was mounted on a glass capillary with epoxy resin. The sample temperature was controlled by an Oxford Cryosystems cooling device. The data were collected, integrated, and corrected for absorption with CrysAlis software (Rigaku Oxford Diffraction, Yarnton, UK) [46 ]. Unit cell parameters obtained from integrated and corrected data were used. A summary of the obtained unit-cell parameters is presented in Table S1 in the Supporting Information.
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2

X-ray Structure Analysis of Compounds

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For X-ray structure analyses, the crystals
were mounted onto the tip of glass fibers. Data collection was performed
with a Bruker-AXS SMART APEX CCD diffractometer using graphite-monochromated
Mo Kα radiation (0.71073 Å) for 2a2d and 3 and on an Agilent Technologies SuperNova
(single source, Cu Kα radiation, λ = 1.5418 Å) for 57. The data were reduced to Fo2 and corrected for absorption effects
with SAINT(70 ) and SADABS,71 (link),72 respectively. The structures
were solved by direct methods and refined by a full-matrix least-squares
method (SHELXL97).73 (link) If
not noted otherwise, all non-H atoms were refined with anisotropic
displacement parameters. All H atoms were located in calculated positions
to correspond to standard bond lengths and angles. All diagrams were
drawn with 30% probability thermal ellipsoids, and all H atoms were
omitted for clarity. Crystallographic data (excluding structure factors)
for the structures of compounds 2a2d, 3, and 57 reported
in this paper have been deposited with the Cambridge Crystallographic
Data Centre as supplementary publications CCDC 1024428 (2a), 1024431 (2b), 1024432 (2c), 1024430
(2d), 1024429 (3), 1024433 (5), 1024434 (6), and 1024435 (7). Copies
of these data can be obtained free of charge at http://www.ccdc.cam.ac.uk/products/csd/request/.
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3

Single Crystal Structure Determination of Adsorbed ZJU-300

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SCXRD data were collected at 284 K for ZJU-300 and at 200 K for C2H2@ZJU-300a and C2H4@ZJU-300a on an Agilent Supernova charge-coupled device diffractometer equipped with graphite-monochromatic enhanced Mo-Kα radiation (λ = 0.71073 Å). A single crystal of solvent-exchanged ZJU-300 was selected and put into a capillary glass tube with inner diameter of 0.2 mm. This crystal was evacuated at 363 K for 12 hours, and the capillary glass tube was filled by pure C2H2 or C2H4 gas up to 1 bar and then sealed to obtain C2H2-loaded or C2H4-loaded ZJU-300a crystal. The datasets were corrected by empirical absorption correction using spherical harmonics, implemented in the SCALE3 ABSPACK scaling algorithm. The structure was solved by direct methods and refined by full-matrix least-squares methods with the SHELX-97 program package (60 ). The crystal data are summarized in table S1.
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4

Synthesis and Characterization of Novel Compounds

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Cupric bromide (CuBr2) was purchased from Shanghai Xinbao Fine Chemical Factory (Shanghai, China). Tetrahydrofuran (THF) and acetonitrile (CH3CN) were distilled over CaH2 and stored under N2 atomsphere. Compounds 17 were synthesized by following our previous reports [37 (link)–38 (link)].
The electrochemical properties of 17 were recorded on a RST 5000 electrochemical workstation at a scan rate of 50 mV s−1, with glassy carbon discs as the working electrode, Pt wire as the counter electrode, and a SCE electrode as the reference electrode. The concentration was 5 × 10−4 mol L−1 in CH2Cl2, and the supporting electrolyte was (n-Bu)4N·PF6 (0.1 mol L−1). The measurement was performed at 20 °C after bubbling the solution with N2 gas for 15 min.
The X-ray diffraction measurement was carried out on SuperNova (Agilent) type diffractometer. The crystal structure was solved by a direct method SIR2004 [61 (link)] and refined by a full-matrix least-squares method on F2 by means of SHELXL-97 [62 ]. The X-ray powder diffraction (XRPD) pattern was recorded on X’Pert PRO (PANalytical). The temperature dependence of the magnetic susceptibility was measured on a SQUID magnetometer of Quantum Design MPMS-XL applying a magnetic field of 1 kOe. The data were corrected for core diamagnetism estimated from the sum of the Pascal constants [63 ].
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5

X-Ray Crystallographic Analysis of Compound 4r

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Single crystals of 4r were C19H26ClN5O2 (CCDC 1437627 contains the supplementary crystallographic data for this paper. These data can be obtained free of charge via http://www.ccdc.cam.ac.uk/conts/retrieving.html (or from the CCDC, 12 Union Road, Cambridge CB2 1EZ, UK; Fax: +44 1223 336033; E-mail: deposit@ccdc.cam.ac.uk), shown in Figure 1). A suitable crystal was selected an analyzed on a SuperNova, Dual, Cu at zero, Atlas diffractometer (Agilent, CA, USA) PW. The crystal was kept at 180.01(10) K during data collection. Using Olex2 [30 (link)], the structure was solved with the Superflip [31 (link)] structure solution program using Charge Flipping and refined with the Shelx [32 (link)] refinement package using Least Squares minimisation.
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6

Single-Crystal X-Ray Diffraction Analysis

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Single-crystal X-ray diffraction data were collected at 293(2) K with an Agilent SuperNova diffractometer with micro-focus X-ray on Cu-Kα radiation (λ = 1.5418 Å) for compounds 2 and 4 and on Mo-Kα radiation (λ = 0.71073 Å) for compound 5. CrysalisPro software was used to collect, index, scale and apply analytical absorption correction.25
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7

Crystal Structure Determination of NDNA

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To observe the geometry of molecules and their interactions in the unit cell, we have crystalized the compound I (NDNA). Good-looking crystals were taken to the microscope for the final selection of sample for mounting on the diffractometer. The selected crystal was fixed over the tip of a thin glass fiber adsorbed in wax on a copper rod with a magnetic base. This holder was mounted on an Agilent SuperNova (dual source) Agilent Technologies Diffractometer, equipped with graphite-monochromatic Cu/Mo Kα radiation source for data collection. The data collection was accomplished using the CrysAlisPro software63 at 296 K under Cu Kα radiation. The structure solution was performed and refined by full-matrix least-squares methods on F2 using SHELXL-97,64 (link) in-built with WinGX.65 (link) All non-hydrogen atoms were refined anisotropically by full-matrix least-squares methods.64 (link) Figures were drawn using PLATON66 and ORTEP-3.67 (link)All the aromatic hydrogen atoms were positioned geometrically and treated as riding atoms with C–H = 0.93 Å and Uiso (H) = 1.2 Ueq (C) carbon atoms. The N–H = 0.99(6) Å and O–H = 0.93(6) Å; the hydrogen atoms were located with the difference Fourier map and refined with Uiso (H) = 1.2 Ueq (N) and Uiso (H) = 1.5 Ueq (O), respectively. The CIF of the NDNA has been submitted to the Cambridge Crystallographic Data Centre (CCDC).
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8

Analytical Absorption Correction for Single Crystal X-Ray Diffraction

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Agilent SuperNova (Single source at offset, Eos) diffractometer

Absorption correction: analytical [CrysAlis PRO (Agilent, 2012 ▶ ), using a multi-faceted crystal model based on expressions derived by Clark & Reid (1995 ▶ )] Tmin = 0.726, Tmax = 0.863

4194 measured reflections

2592 independent reflections

2297 reflections with I > 2σ(I)

Rint = 0.019

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9

Single-Crystal Structure Analysis of LDU-1

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Single-crystal structure analysis of LDU-1 was performed at 293(2) K on an Agilent SuperNova diffractometer equipped with a copper micro-focus X-ray sources (λ = 1.54178 Å). The data were collected with an ω-scan mode in an arbitrary φ-angle. Data reduction was performed with the CrysAlisPro package, and an analytical absorption correction was performed. The structure was solved by direct methods and refined by full-matrix least-squares on F2 with anisotropic displacement using the SHELXL software package [32 ]. The non-H atoms were treated anisotropically, whereas the aromatic and hydroxyl hydrogen atoms were placed in calculated ideal positions and refined as riding on their respective carbon or oxygen atoms. The structure was examined using the Addsym subroutine of PLATON to ensure that no additional symmetry could be applied to the models [33 ].
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10

Powder X-ray Diffraction of Samples

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PXRD was carried out with a microfocus
spot single crystal diffractometer
(SuperNova, Agilent Technology Co., Ltd., Poland), and Cu Kα
radiation (λ = 1.54 Å) was used as the X-ray source. The
sample was pretreated by this method that was placed into a sample
holder and pressed by a glass slide to ensure coplanarity between
surfaces of the powder and the sample holder.27 (link) Then, the sample was scanned over the 2θ range of 5–35°
with a step size of 0.04°/s, an operating condition with a voltage
of 50 kV, and a current of 35 mA.
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