Evo 40 ep
The EVO 40 EP is a scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging of samples at the microscopic level. The EVO 40 EP utilizes an electron beam to scan the surface of the sample, generating detailed images that reveal the topography and composition of the specimen.
9 protocols using evo 40 ep
Aerosol Particle Analysis via SEM-EDX
SEM Visualization of Antifungal Activity
Characterization and Motion of Microtubes
microtubes was defined using Zeiss EVO-40EP or Zeiss Auriga scanning
electron microscope (SEM) and Zeiss Libra 200FE transmission electron
microscope (TEM). The chemical composition of the samples was determined
by electron probe microanalysis (EPMA) using a SEM equipped with an
INCA 350 energy-dispersive X-ray spectrometry (EDX) analyzer (Oxford
Instruments). X-ray diffraction (XRD) analysis was performed with
a Rigaku Miniflex II diffractometer. Before X-ray measurement, the
samples of the microtubes were dispersed and placed on a SiO2 amorphous glass support. The operation conditions were Cu Kα
radiation, 30 kV voltage, and 10 mA current.
To analyze the
capability of microtubes to move in water, a number of microtubes
with a diameter of about 10 μm and a length of 100 μm
were immersed in a 10% H2O2 aqueous solution.
The motions of the microtubes were captured by an optical microscope
Biolam (manufactured by LOMO) equipped with an Almeria digital camera.
Structural and Thermal Analysis of Sm2CuZrO6
structural crystallinity
of the synthesized material was assessed using X-ray diffraction (XRD)
with the AXRD Benchtop powder diffractometer from Proto Manufacturing
Limited. Thermogravimetric analysis (TGA, Q-500) and differential
thermal analysis (DTG, Rigaku TG8120, Japan) determine the thermal
stability of the compound. The structural morphology and elemental
composition of Sm2CuZrO6 double perovskites
were examined using scanning electron microscopy (SEM; ZEISS EVO40EP,
Germany) and an energy-dispersive X-ray analysis (EDX) system connected
to a transmission electron microscope (TEM; JEM 2100 F, JEOL Ltd.,
Japan), respectively. All electrochemical measurements were conducted
using a Versa STAT-3.
Scanning Electron Microscopy of Bacterial Isolates
Membrane Morphology Characterization by SEM
Characterization of Streptomyces Isolate MN 2(6)
Membrane Surface Morphology Analysis
SEM Analysis of Curcuma longa-Treated Bacteria
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