The surface morphology of the topographical substrates and flat substrates was investigated by scanning electron microscopy (SEM) (Hitachi Japan; apparatus working at 10 keV accelerating voltage), atomic force microscopy (AFM; DME DS 95 Navigator 220), and optical microscopy (Nikon Optiphot 200). Before SEM imaging, all samples were coated with a thin layer of gold using a sputtering machine. AFM contact mode was performed using a rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) with a spring constant of 2.8 N m−1 and a conical tip of 8 nm radius. The sample's surface up to 90 μm2 was scanned by a scan rate of 0.05 Hz and setpoint force 0.5 nN. The standard software of the instrument (JPKSPM Data Processing) was utilized for image analysis.
Optiphot 200
Manufactured by Nikon
Sourced in Japan
The Optiphot 200 is a Nikon laboratory microscope designed for a variety of applications. It features a sturdy, ergonomic design and provides high-quality optical performance. The Optiphot 200 is equipped with various observation methods, including brightfield, darkfield, and phase contrast, allowing for versatile imaging capabilities.
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Lab products found in correlation
2 protocols using optiphot 200
1
Surface Morphology Analysis of Topographical Substrates
2
Topographical Substrate Surface Characterization
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The surface morphology of the topographical substrates and flat substrates was investigated by scanning electron microscopy (SEM) (Hitachi Japan; apparatus working at 10 keV accelerating voltage), atomic force microscopy (AFM; DME DS 95Navigator 220) and optical microscopy (Nikon Optiphot 200). Before SEM imaging, all samples were coated with a thin layer of gold using a sputtering machine. AFM contact mode was performed using a rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) with a spring constant of 2.8 N/m and a conical tip of 8 nm radius. The surface of the sample up to 90 μm 2 was scanned by a scan rate of 0.05 Hz and setpoint force 0.5 nN. The standard software of the instrument (JPKSPM Data Processing) was utilized for image analysis.
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