Jem 2100f microscopy
The JEM-2100F is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is capable of providing detailed images and analysis of materials at the nanoscale level. The JEM-2100F features advanced optics and electronic systems to enable high-resolution imaging and analytical capabilities.
Lab products found in correlation
2 protocols using jem 2100f microscopy
Characterization of Porous NiMn2O4 Nanosheets
Characterizing Nanoparticle Size and Zeta Potential
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