Xl 30 esem tmp scanning electron microscope

Fourier transform-infrared (FT-IR) measurements were performed on a Bruker VERTEX 70 spectrometer. The FT-IR spectra were recorded in 400 ÷ 4000 cm⁻¹ range with 4 cm⁻¹ resolution. The samples were analyzed from KBr pellets.
The X-ray photoelectron spectroscopy (XPS) spectra were registered on a Thermo Scientific K-Alpha equipment, fully integrated, with an aluminum anode monochromatic source. Charging effects were compensated by a flood gun. Pass energy of 200 eV and 20 eV were used for surgery and high resolution spectra aquisition respectively.
Thermogravimetric analysis (TGA) was done on a Q500 TA Instruments equipment. 2 mg of sample was heated from RT to 700 °C using a heating rate of 10 °C/min under constant nitrogen flow rate.
UV adsorption measurements of BZC were performedat λ = 262 nm on a UV 3600 Shimadzu equipment provided with aquartz cell having a light path of 10 mm.
The morphological characterization of the CS/Al-MSN-BZC composite films was evaluated from the micrograph recorded using a Philips Xl 30 ESEM TMP scanning electron microscope (SEM).

Efflorescences blooming at fissures were identified using SEM–EDS and XRD. The morphologies of samples on carbon tape were examined using a Philips XL 30 ESEM/TMP scanning electron microscope coupled to an energy-dispersive spectrometer (EDS; EDAX type Sapphire) at the Faculty of Earth Sciences, University of Silesia. Analytical conditions were: accelerating voltage 15 kV, working distance ca 10 mm, and counting time 40 s. In addition, powdered samples were examined using a Bruker AXS D8 ADVANCE diffractometer in the X-Ray Diffraction Laboratory, Institute of Geological Sciences, Polish Academy of Sciences and an X-ray Philips PW 3710 diffractometer at the Faculty of Earth Sciences, University of Silesia. Efflorescence phase compositions are given in Table S2.