Nanoscope 5 controller

Atomic force microscopy (AFM) was used to elucidate the tendency of AgNPs to agglomerate in DMEM culture medium and the susceptibility of serum components to agglomerate in the presence of AgNPs. The appropriate suspensions were deposited on atomic flat mica substrate (V1 grade, Ted Pella Inc., USA) and allowed to dry under N₂ stream. AFM height sensor images were collected in Peak Force Tapping mode using Bioscope Catalyst II atomic force microscope equipped with Nanoscope V controller (Veeco, Santa Barbara, CA, USA). AFM topography imaging was performed in the air using Bruker silicon scanasyst-fluid + probes. Images were processed and analyzed for nanoparticle height by means of Nanoscope Analysis (v. 1.40 R3sr5, Bruker) software.

Surface morphology of the test samples was studied by the atomic force microscopy on a Multimode microscope with a Nanoscope V controller (Veeco, Plainview, New York, NY, USA). The atomic force microscopy (AFM) observations were performed in air at room temperature under the non-resonance scanning mode (PeakForce Tapping QNM). As probes, the cantilevers based on silicon nitride with a single-crystalline silicon tip SNL-10 (Bruker, Billerica, MA, USA) were used; the nominal resonance frequency was 65 kHz, and the force constant was 0.35 N m⁻¹.

To probe cellulose microfibrils in cell walls, the primary roots of wild-type and mutant seedlings were subjected to AFM as described previously (Zhang et al. 2019 (link)). The root tips were cut and treated in a peracetic acid solution (11%, v/v) at 85 °C for 3 h. After extensive rinsing, the exposed cell walls of detached root cortex cells were imaged in the air by using a multimode scanning probe microscope (MM-SPM; Bruker) with an advanced NanoScope V Controller (Veeco). All obtained images were scanned in 1-μm scale at 512 × 512 pixels using a ScanAsyst-Air probe (Bruker). The raw images were flattened to remove tilt or bow and then exported in the TIFF format using Nanoscope Analysis (version 1.8; Bruker).

Atomic force microscopy (AFM) imaging was carried out with Veeco Dimension 5000 Scanning Probe Microscope equipped with NanoScope V controller (Veeco Inc., Santa Barbara, CA, USA) and HQ:NSC14/AlBS tips (with a nominal radius of 8 nm; MicroMasch). Samples used for AFM imaging were glass slides coated with Hydrobead Standard and Glaco Mirror Coat Zero.

Surface morphology of the test samples was studied by atomic force microscopy (AFM) on a Multimode microscope with a Nanoscope V controller (Veeco, Plainview, New York, NY, USA). The atomic force microscopy (AFM) observations were performed in air at room temperature under the tapping mode. As probes, high aspect ratio polysilicon cantilevers (TipsNano, Tallinn, Estonia) were used; the nominal resonance frequency was 125 kHz, the force constant was 3.5 N m⁻¹, and Q-factor was about 280. Image processing was performed using FemtoScan Online software (Advanced Technologies Center, Moscow, Russia) [32 (link)].

The morphology of biofilms formed on glass and PVC surfaces was examined by atomic force microscopy (AFM). AFM measurements were performed in air using a Bioscope II AFM with a NanoScope V controller (Veeco, Santa Barbara, CA, USA). Biofilms were imaged in contact mode using an MLCT-D silicon nitride cantilever with a nominal tip apex radius of 20 nm. The height and deflection images were obtained simultaneously at a scan rate 0.5 Hz, at a resolution of 512 pixels per line. Each image has been done in different places selected randomly from 30 × 30 µm² area, for a sample. AFM images were flattened and plane fitted prior to analysis. The calculated surface characteristics parameters included the root mean square (RMS) roughness (Rq), average height and surface area differences. The Rq is the root mean square average of height deviations taken from the mean data plane. Average height is the average of all the Z values. Surface area difference is the difference between the analyzed region’s three dimensional surface area and its two dimensional projected surface area. The data were analyzed with the NanoScope Analysis 1.7 software from Bruker. AFM imaging was performed in the Center of Quantum Optics at the Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń, Poland.