Co. Ltd.). Synchrotron XRPD patterns were recorded on a large Debye–Scherrer
camera installed at SPring-8 BL02B2 (JASRI/SPring-8) using an imaging
plate as a detector. Atomic force microscope SPM-8100FM (Shimadzu)
was used for the measurements of FM-AFM. Electronic absorption spectra
in the solid state were observed from the diffused reflection method
with the conversion of the y-axis by UV-3600 (Shimadzu).
Polarized electronic absorption spectra using an optical waveguide
system was obtained using a modified SIS-5100 attached with a Glan–Taylor
polarizer prism (System Instruments Co.). Luminescence and excitation
spectra were recorded on a Fluorolog 3-22 (Horiba Jobin Yvon). Absolute
luminescence quantum yields and luminescence lifetimes were determined
using an absolute luminescence quantum yield C9920-02 spectrometer
(Hamamatsu Photonics K. K.) and a Quantaurus-Tau C11367-12 spectrometer
(Hamamatsu Photonics K. K.), respectively, with pulsed excitation
light sources.