S 4700 fe sem
The S-4700 FE-SEM is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed for high-resolution imaging and analysis of a wide range of materials. The S-4700 FE-SEM utilizes a field emission electron source to produce a high-brightness, fine-diameter electron beam, enabling high-resolution imaging and analysis at low accelerating voltages.
Lab products found in correlation
51 protocols using s 4700 fe sem
Characterization of Paclitaxel-Loaded Nanoparticles
Scanning Electron Microscopy of Stressed RBCs
Microscopic Analysis of Patterned Surfaces
Characterization of Strontium Particles
Comprehensive Materials Characterization Protocol
Thermogravimetric analyses (TGA) were performed on a PerkinElmer STA 6000 thermal analyzer. For this purpose, ca. 20 mg of sample was placed into an alumina crucible and heated in a continuous-flow of N2 with a heating ramp rate of 20 °C min−1 from 30 °C to 900 °C. The scanning electron micrographs were taken on a Hitachi S-4700 FE-SEM. The UV-vis spectra were recorded on a JASCO V-570 spectrophotometer.
Characterization of Biomaterial Scaffolds
Characterizing PCL/B3 Glass Scaffolds
Tensile Strength of Y-TZP Adhesive
Morphological Analysis of Synthetic n-ZnO
Characterization of Microgroove Patterns in PCL Scaffolds
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