Multianodephotomultiplier

Manufactured by Nikon

The Multianodephotomultiplier is a specialized laboratory equipment used for the detection and measurement of low-intensity light signals. It converts light energy into an electrical signal, allowing for the precise quantification of photon counts. The device features multiple anodes, enabling it to capture and process multiple light signals simultaneously.

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Lab products found in correlation

Eclipse ti, by Nikon (2 mentions) Digital sight u2, by Nikon (1 mentions) A1r mp, by Nikon (1 mentions) Nova nanosem 450 system, by Thermo Fisher Scientific (1 mentions) A1r mp system, by Nikon (1 mentions) Dimension icon system, by Bruker (1 mentions)

2 protocols using multianodephotomultiplier

Multimodal Microscopic Imaging Techniques

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Bright-field images are
acquired by an inverted microscope (IX71, Olympus), illuminating samples
by a W lamp. Fluorescence micrographs are collected by exciting with
a Hg lamp through a 20× objective of another inverted microscope
(Eclipse Ti, Nikon) and collecting emission maps by a charge-coupled
device (CCD) detector (Digital Sight-U2, Nikon). Confocal fluorescence
imaging is performed by an inverted microscope equipped with a laser
scanning confocal head (A1R-MP, Nikon). To this aim, samples are excited
by a laser diode (λ_exc = 408 nm) through a 20×
objective, whereas the emitted light is collected by the same objective
and measured by a spectral detection unit equipped with a multianode
photomultiplier (Nikon).

Camposeo A., Granger D.B., Parkin S.R., Altamura D., Giannini C., Anthony J.E, & Pisignano D. (2019). Directed Functionalization Tailors the Polarized Emission and Waveguiding Properties of Anthracene-Based Molecular Crystals. Chemistry of Materials, 31(5), 1775-1783.

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Multi-Modal Characterization of Nanopatterned Surfaces

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Confocal micrographs are acquired by an inverted microscope Eclipse Ti equipped with a confocal A1R-MP system (Nikon), using an Argon ion laser (excitation wavelength, λ = 488 nm). The sample emission is collected by a 60× (oil immersion NA = 1.40, Nikon) objectives and the fluorescence signal is detected by a spectral detection unit equipped with a multi-anode photomultiplier (Nikon).
The AFM characterization of the nanopatterned surfaces is carried out by “peak force” imaging mode in air using a Bruker Dimension Icon system equipped with a Nanoscope V controller. The used silicon tip (nominal radius of curvature of 2 nm) is mounted on silicon nitride cantilever with 0.4 N/m nominal spring constant. SEM is performed with a Nova NanoSEM 450 system (FEI), using an acceleration voltage around 8 kV and an aperture size of 30 mm.

Portone A., Ganzer L., Branchi F., Ramos R., Caldas M.J., Pisignano D., Molinari E., Cerullo G., Persano L., Prezzi D, & Virgili T. (2019). Tailoring optical properties and stimulated emission in nanostructured polythiophene. Scientific Reports, 9, 7370.

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