Fastscan c
The FastScan C is a high-speed atomic force microscopy (AFM) system designed for advanced nanocharacterization. It provides fast and precise topographical imaging of samples at the nanoscale level.
8 protocols using fastscan c
Atomic Force Microscopy of DNA-Protein Interactions
Visualizing DNA-Protein Interactions on Mica
Atomic Force Microscopy Analysis of gltA Promoter
AFM Nanomechanical Mapping Technique
measurements were performed with a Bio FastScan scanning probe microscope
(Bruker AXS). All images were obtained using the PeakForce QNM (PeakForce
quantitative nanomechanical mapping) mode with a FastScan C (Bruker)
silicon probe (spring constant of 0.45 N/m).
The measurements
were performed under environmental conditions in the acoustic hood
to minimize vibrational noise. The images were captured in the retrace
direction at a scan rate of 1.6 Hz. The image resolution was 512 samples/line.
For image processing and thickness analysis, Nanoscope Analysis software
was used. The “flattening” and “planefit”
functions were applied to each image.
Nanoscale Peptide Imaging on Graphite
Quantitative Nanomechanical Mapping by AFM
Binding Dynamics of SsrB on csgD Promoter
Lipid Sample Characterization by AFM
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