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Hq nsc18 al bs

Manufactured by MikroMasch
Sourced in Bulgaria

The HQ:NSC18/Al BS is a lab equipment product developed by MikroMasch. It serves as a key component in various scientific and research applications. The core function of this product is to provide a reliable and precise platform for measurements and analysis.

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4 protocols using hq nsc18 al bs

1

Surface Morphology Analysis of Topographical Substrates

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The surface morphology of the topographical substrates and flat substrates was investigated by scanning electron microscopy (SEM) (Hitachi Japan; apparatus working at 10 keV accelerating voltage), atomic force microscopy (AFM; DME DS 95 Navigator 220), and optical microscopy (Nikon Optiphot 200). Before SEM imaging, all samples were coated with a thin layer of gold using a sputtering machine. AFM contact mode was performed using a rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) with a spring constant of 2.8 N m−1 and a conical tip of 8 nm radius. The sample's surface up to 90 μm2 was scanned by a scan rate of 0.05 Hz and setpoint force 0.5 nN. The standard software of the instrument (JPKSPM Data Processing) was utilized for image analysis.
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2

Microstructural Analysis of Tendon Tissue

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SEM microscopy was performed to investigate the microstructure of tendon tissue, pattern, and topography of cell replica and tissue replica and cell morphology on sheets. For cell fixation, 2.5% glutaraldehyde was added to all samples so as to cover all the sheets. All samples were dehydrated using ethanol with increasing concentration (serial dilution 50-100%). After drying, the specimens were coated with a thin layer of gold and then were viewed under a TESCAN VEGA3 SEM at an accelerating voltage of 30 kV. In order to investigate the topography of cell replica, AFM (NanoWizard 4a NanoScience, JPK Instruments AG, Berlin, Germany) contact A c c e p t e d M a n u s c r i p t mode imaging was performed. A rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) was used with spring constant of 2.8 N/m and a conic tip of 8 nm radius. Using a scan rate of 0.05 Hz and setpoint force of 0.5 nN, surface areas up to 100 2 µm were scanned. Image analysis was done using standard software of the instrument (JPKSPM Data Processing).
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3

AFM Imaging of Samples in Air and Liquid

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AFM imaging in air was carried out using a JPK Nanowizard ULTRA Speed (Berlin, Germany), an Agilent 5100, and an Agilent 5500 AFM (Santa Clara, CA, USA), operated in intermittent contact mode. AFM imaging in liquid was carried out using a JPK Nanowizard ULTRA Speed. For measurements under dry and liquid conditions, HQ-NSC18/AlBS (MikroMasch, Sofia, Bulgaria) and USC-F0.3-k0.3 cantilevers (NanoWorld, Neuchâtel, Switzerland) were used, respectively.
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4

Topographical Substrate Surface Characterization

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The surface morphology of the topographical substrates and flat substrates was investigated by scanning electron microscopy (SEM) (Hitachi Japan; apparatus working at 10 keV accelerating voltage), atomic force microscopy (AFM; DME DS 95Navigator 220) and optical microscopy (Nikon Optiphot 200). Before SEM imaging, all samples were coated with a thin layer of gold using a sputtering machine. AFM contact mode was performed using a rectangular cantilever (HQ:NSC18/Al BS, MikroMasch, Bulgaria) with a spring constant of 2.8 N/m and a conical tip of 8 nm radius. The surface of the sample up to 90 μm 2 was scanned by a scan rate of 0.05 Hz and setpoint force 0.5 nN. The standard software of the instrument (JPKSPM Data Processing) was utilized for image analysis.
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