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Digital micrograph program

Manufactured by Ametek

Digital Micrograph is a software program designed for image acquisition, processing, and analysis. It provides a comprehensive suite of tools for users to capture, manipulate, and interpret digital images obtained from various microscopy techniques.

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4 protocols using digital micrograph program

1

Characterizing G-wire Morphology

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Thicknesses and lengths of G-wires, which were nicely separated on SEM and TEM images were measured by hand using Gatan Digital Micrograph program. In total 30 measurements were done for each type of measurement and image type.
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2

Serial Block Face SEM Imaging of Platelets

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Resin-embedded blocks of stained pelleted platelets were first mounted on empty resin blocks for trimming in a Leica EM UC6 microtome. After the surface of the pellet was exposed, the block was remounted, exposed-side down, on an aluminum specimen pin (Gatan, Pleasanton, CA) using CircuitWorks Conductive Epoxy (CW2400), which grounded the sample electrically to the pin. Each sample was then trimmed again to expose the opposite side, and sputter-coated with a 40 nm gold layer. The trimmed block was imaged at an accelerating voltage of 1.8 kV in a Zeiss SIGMA-VP (variable pressure) scanning electron microscope (SEM) equipped with a Gatan 3View serial block face (SBF) imaging system [21 (link)–22 (link), 24 ]. The SEM was operated in the high vacuum mode with a 30 μm condenser aperture, and images containing 2000 × 2000 pixels were acquired using the Gatan DigitalMicrograph program with a pixel size of 5.5 nm in the x–y plane. The diamond knife of the SBF system was set to cut the block 1.2 mm/s with a slice thickness of 30 nm, thus providing a 30-nm pixel size along the z-axis. Resulting 250 image slices (total thickness of 7.5 μm) were assembled into a volume file and aligned, using the DigitalMicrograph software.
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3

High-Resolution TEM Imaging Protocol

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HR-TEM images have been obtained employing a Jeol JEM 3010-UHR (Japan) microscope equipped with LaB6 filament (potential acceleration 300 kV). Images were digitally acquired using an Ultrascan 1000 camera and processed with Gatan Digital Micrograph program version 3.11.1. Before the analysis, samples were dry dispersed onto Cu grids coated with lacey carbon film.
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4

Characterization of Sintered Compacts

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Gatan PIPS ion milling and plasma cleaning (SOLARUS Gatan) were used for the thinning and cleaning of sintered compacts, respectively. Ion milling was conducted with a low energy elec-tron beam at an angle of 4°to produce an electron-transparent TEM specimen. HAADF-STEM observations were carried out on JEM-ARM200F, which is fitted with Cs aberration correctors operated at 200 kV. To minimize radiation damage, STEM was operated at a low-dose condition with probe size of ∼0.8 Å and a beam current of ∼10 pA, resulting in a dose current of 0.066 pA cm -2 . In contrast, the TEM mode is operated at a dose current of 68.5 pA cm -2 . The chemical distribution of the incorporation of Ag was examined using electron energy-loss spectroscopy (EELS) with a 0.2 nm electron beam diameter JEM-ARM200F, equipped with energy-dispersive X-ray spectroscopy (EDS). 53 The images were captured by an annular dark-field detector with a collection angle from 68 to 280 mrad. The probe convergence angle was 24.45 mrad. Inverse fast Fourier transform (IFFT) HAADF-STEM images were obtained with the Gatan Digital Micrograph program.
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