Ab204 n analytical balance

Transmission electron microscopy (TEM) images were taken with a JEOL 2011 microscope (Japan) at 200 kV. Fourier transform infrared (FT-IR) spectra were collected on a Nicolet Nexus 470 Fourier spectrophotometer (USA) using KBr pellets. The nitrogen sorption isotherms, pore size distribution and Brunauer–Emmett–Teller (BET) surface area were measured at 250 °C with a Micromeritics TriStar 3000 analyzer (USA). Powder X-ray diffraction (XRD) measurements were performed with a Bruker D4 X-ray diffractometer with Ni-filtered Cu Kα radiation (40 kV, 40 mA). For all of the chemicals and reagents, an AB204-N analytical balance (Mettler Toledo, Switzerland) was used for weighing. Stirring was performed by an HD2004W constant speed mechanical stirrer (Sile, China).

The polishing regimen was implemented via an E460 polishing machine (Alpsitec Inc., Vinoux, France) using a Politex polishing pad from Dow Chemical Company, Midland, MI, USA. The polishing substrate was a CoCrMo alloy disk with a radius of 3.8 cm. The specific parameters included a polishing pressure of 1.5 psi, a slurry flow rate of 0.3 L/min, a polishing head speed of 87 rpm, and a polishing disc plate speed of 93 rpm. To mitigate inter-group discrepancies, the polishing pad was pre-conditioned using a diamond dresser for 300 s before each polishing sequence. Post-polishing, the CoCrMo alloy disk was rinsed with deionized water and dried using high-purity N₂ steam. A Mettler Toledo AB204-N analytical balance, with an accuracy of 0.1 mg, was used to measure the weight change pre- and post-polishing to compute the cobalt disc removal rate. Each recorded weight value was given as the average of three trials in order to minimize measurement error.
To quantify the removal rate during the CMP process, we employed the following equation: $$\mathrm{removal} \mathrm{rate}=\frac{\mathsf{\Delta }\mathrm{m}}{\mathsf{\rho }\times \mathrm{A}\times \mathrm{t}}$$