Spectrometer model ftir 8400s

The functional groups in the samples were identified using a Fourier transform infrared (FTIR) spectrometer (Spectrometer Model FTIR-8400S, Shimadzu, Japan) in the range 400.0 to 4000.0 cm⁻¹. A scanning electron microscopy (SEM, Joel Jsm6360LA, Tokyo, Japan) was used to observe the morphology of the synthesized CMC, CMC-Cu-MEL, and CMC-Zn-MEL materials. Additionally, a transmission electron microscope (TEM) in a Jeol-1230 electron microscope was used to affirm the size of the prepared particles of CMC, CMC-Cu-MEL, and CMC-Zn-MEL materials. The crystallinity of the synthesized CMC, CMC-Cu-MEL, and CMC-Zn-MEL materials was studied via X-ray diffraction (XRD; TD-3500 diffractometer, Dandong Mastery Technology Co., Ltd, Dandong, China) at room conditions with Ni-filtered CuKα radiation (λ = 1.5418° A), at 40 kV and 30 mA. Raman spectroscopy was utilized to study the stability of the chemical structure of the prepared CMC, CMC-Cu-MEL, and CMC-Zn-MEL materials using a Raman spectrometer (Horiba Scientific, Unit D Fletcher, CA, USA). The nitrogen adsorption–desorption isotherm was utilized to determine the impact of Cu and Zn oxide incorporation on the CMC matrix by using the Brunauer–Emmett–Teller (BET) method at 77 K (Tristar II 3020 version 3.02, Norcross, GA, USA).

A Fourier transform infrared (FTIR) spectrometer (Spectrometer Model FTIR-8400S, Shimadzu, Japan) was utilized in the range of 400.0 to 4000.0 cm⁻¹ for the determination of the functional groups in the samples. Thermogravimetric analysis (TGA) was completed using a thermogravimetric device (Model-Q 500- Lukens Drive, TA Instruments, New Castle, DE, USA) to measure the thermal steadiness of CH/Zn@H₃BTC. Field emission scanning electron microscopy (FESEM) (Model-JOEL-JXA-840-Tokyo 196-8558, Japan) was used to inspect the surface morphology of CH, Zn@H₃BTC, and CH/Zn@H₃BTC.