An attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectrometer (
Spectrum 100, Perkin Elmer, Waltham, MA, USA) equipped with a Ge crystal ATR unit (
VariGATR, Harrick Scientific Products, Pleasantville, NY, USA) was used to detect the characteristic functional groups on the bare PEEK, UV light-irradiated PEEK and MePRX-PEEK surfaces.
All the spectra were recorded in the frequency range of 1,000-4,000 cm -1 at a resolution of 4 cm -1 and analyzed using
Spectrum Express software (PerkinElmer). Static contact angle analysis was performed in an air atmosphere using a contact angle measurement instrument (DropMaster DM-501, Kyowa Interface Science, Saitama, Japan) for four types of PEEK surfaces: bare, MePRX-VBn-coated, UV light-irradiated, and UV light-irradiated MePRX-VBn-coated PEEK surfaces. All samples were washed with DMSO and ethanol and then dried at 60°C. A single water droplet (5 μL) was placed on each surface and monitored using a charge-coupled device camera at 23°C. The captured images were analyzed using FAMAS version 5.0.0 software (Kyowa Interface Science).
Arisaka Y., Hakariya M., Iwata T., Masuda H., Yoda T., Tamura A, & Yui N. (2021). Surface-tethering of methylated polyrotaxanes with 4-vinylbenzyl groups onto poly(ether ether ketone) substrates for improving osteoblast compatibility. Dental materials journal, 40(3).