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Dxr raman microscope

Manufactured by Thermo Fisher Scientific
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The DXR Raman microscope is a scientific instrument designed for Raman spectroscopy analysis. It provides high-resolution imaging and spectroscopic capabilities for the characterization of materials at the microscopic level. The core function of the DXR Raman microscope is to capture and analyze the inelastic scattering of monochromatic light, which can provide detailed information about the chemical composition and molecular structure of the sample under investigation.

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168 protocols using dxr raman microscope

1

Raman Microscopy Characterization Protocol

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The imaging system used in this study was a DXR Raman Microscope (Thermo Scientific, Waltham, USA), equipped with a diode-pumped, solid state (DPSS) green laser (λ = 532 nm) with a maximum power of 10.0 mW, a diffraction grating of 900 lines per mm and a pinhole confocal aperture of 25 μm. The Raman light was detected with an air-cooled CCD detector with a spectral resolution of 4 cm-1. The 20x/0,40NA objective was used.
The map was recorded with a spatial resolution of 2 μm in both directions, x, y. The vertical z displacement was fixed. The integration time (8 s) was fixed for each scan. A single spectrum at each point was recorded within the range of 3,500–150 cm-1 of Raman shift for an average of 12 scans. Each pixel corresponds to one average spectrum. The spectra were not normalized.
Also, the Raman spectra of the reference materials were collected on a DXR Raman Microscope (Thermo Scientific, Waltham, MA, USA), with a green laser (λ = 532 nm) and a maximum power of 10.0 mW. The spectra were recorded within the range of 3,500–150 cm-1.
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2

Comprehensive Material Characterization Techniques

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TEM and EDS were analyzed for microstructure and composition on the JEM-2100F electron microscope operated at 200 kV. STEM and element mapping scanning were obtained on field-emission Magellan 400 microscope under the FEI Company. XRD pattern was recorded on a Rigaku D/MAX-2200 PC XRD system. XPS spectrum was recorded on ESCAlab250 (Thermal Scientific). DLS and Zeta potential were tested on Zetasizer Nanoseries (Nano ZS90, Malvern Instrument Ltd.). AFM images were collected on the Veeco DI Nanoscope Multi Mode V system. UV-vis-NIR absorption spectra were recorded on UV-3101 Shimadzu UV-vis-NIR spectrometer. FTIR pattern was recorded for the analysis of chemical bonds. The quantitative analysis of Fe element was conducted on inductively coupled plasma-optical emission spectrometry (ICP-OES, Agilent 725, Agilent Technologies). Raman spectroscopy pattern was collected on a DXR Raman microscope (Thermal Scientific, USA). ESR spectrum was measured using DMPO as the nitrogen trapping agent by Bruker EMX1598 spectrometer.
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3

Comprehensive Characterization of Materials

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Scanning electron microscopy (SEM) was carried out using a field emission scanning electron micro-analyzer (FEI Magellan 400), and transmission electron microscopy (TEM) images were taken by JEM-2100F. Raman spectra were collected on a DXR Raman Microscope (Thermal Scientific Co., USA) with 532 nm excitation length. Nitrogen adsorption–desorption isotherms were measured at liquid nitrogen temperature (77 K) with an ASAP 2010 Accelerated Surface Area and Pore Size Analyzer System (Micrometitics, Norcross, GA). During measuring procedures, the samples were treated at 300 °C overnight under vacuum. The specific surface areas were calculated with the Brunauer–Emmett–Teller (BET) method. The total pore volume was calculated from the amount of nitrogen adsorbed at a relative pressure of 0.99. The pore size distribution curves were calculated by means of the desorption branch of the isotherms using the quenched solid density functional theory (QSDFT). X-ray photoelectron spectroscopy (XPS) measurements were taken using an ESCALAB 250 X-ray photoelectron spectrometer using Al (hv = 1486.6 eV) radiation to analyze the surface of the obtained samples.
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4

Comprehensive Material Characterization

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The morphologies and microstructures of the samples were characterized via field-emission scanning electron microscopy(FE-SEMJSM-6700F). The crystalline phase of the materials was analyzed from X-ray diffraction measurements (Rigaku D/max 2550 V diffractometer). Raman spectroscopy was conducted on DXR Raman Microscope (Thermal Scientific Corporation, USA, wavelength 532 nm). Fourier transform infrared spectroscopy (FTIR) were examined on Nicolet 7000-C.
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5

Characterization of Ru-doped TiO2 Nanomaterials

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X-Ray diffraction (XRD) of the samples was analyzed at ambient temperature on a Bruker D8 Advance diffractometer using the characteristic Kα radiation of copper at a voltage of 40 kV and a current of 40 mA. XRD patterns were collected in the 2θ range between 5° and 80°.
The UV-vis diffuse reflectance spectra of rutile RuxTi1-xO2 were obtained by using a Jasco UV-Vis V-550 spectrophotometer in the wavelength range from 200 to 900 nm with an integrating sphere assembly. The sample was diluted with MgO (ratio 1:6) and then mechanically mixed. The UV-vis absorption was transformed according to the Kubelka Munk function, F(R) , for infinite thick samples. The sample surface elements and their oxidation states were analyzed by Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) system with Al K-alfa radiation. The Raman spectra of samples were registered using a DXR Raman Microscope from Thermo Scientific. The morphology of the samples was characterized by transmission electron microscope Tecnai™ G2 F20 TWIN Cryo-TEM, FEI Company™, through bright field (BF-TEM) and scanning transmission electron microscopy analyses. The TEM was operated under an acceleration voltage of 200 kV. A small drop of well-dispersed sample, ultrasonicated for 5 minutes, was put on a carbon film copper grid and then, visualized on TEM.
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6

Comprehensive Characterization of MoS2 Thin Films

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Raman spectroscopy measurements were carried out using a DXR Raman Microscope
(Thermo Scientific). A laser with an excitation wavelength of
532 nm, a spot size of 0.7 μm, and a power of
8 mW was used. The approximate spectral resolution is
0.5 cm−1, and the
520.8 cm−1 Si peak was used for
normalization. Photoluminescence (LabRam ARAMIS, Horiba Jobin Yvon) measurements
of the grown samples were carried out with a wavelength of 514 nm
and a laser power of 10 mW. The ellipsometry (M2000D, J. A. Woollam
Co.) mapping measurements were carried out with a 0.5-cm step size. The
thickness results were extracted by multi-layer (four-layer model,
air/MoS2/SiO2/Si) modelling. XPS (SES-100, VG-SCIENTA)
measurements were conducted using a non-monochromatic magnesium Kα
source under ultra-high vacuum conditions
(<10−8 Torr).
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7

Comprehensive Characterization of Graphene Quantum Dots

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The optical properties of GQD-1 and GQD-2 were analyzed using a Biochrom
UV–vis absorption spectrophotometer. Photoluminescence (PL)
characteristics of GQD-1 and GQD-2 were analyzed using a FluoroMax-4
Spectrofluorometer—Horiba, the fluorescence spectrophotometer.
GQDs illustrate tunable PL through the manipulation of edge functionality
under distinct preparation conditions. In the current study, the FTIR
instrument employed was 760 Nicolet, and it helped in the detection
of organic as well as inorganic groups present in the GQD samples,
in accordance with their particular IR frequency. The morphologic
characteristics of GQD samples were analyzed using transmission electron
microscopy (HT 770, Hitachi, Japan). The instrument employed for Raman
spectroscopy was a Thermo Fisher Scientific DXR Raman microscope having
a wavelength of 532 nm, 40 times scanning, and a laser power of 0.1–10
mW using 50× microscope objectives. Furthermore, the presence
of GQDs was clearly confirmed by the peaks noted from the Fourier
transform infrared spectroscopy (FTIR) analysis. The FTIR instrument
employed for the GQD analysis, in this study, was a 760 Nicolet FTIR
model. NMR analysis for the two samples for 1H spectra
and 13C was carried out using a JOEL NMR 600 MHz.
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8

Characterization of Carbon Nanotube Forests

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The orientation of the CNT forests was investigated by the means of Scanning Electron Microscopy (SEM), which type was Hitachi S-4700 Type II FE-SEM (5–15 keV). For the careful measurement of CNTs, the sample holder was tilted at a 35° angle within the SEM device, making possible their examination from all directions. The SEM results were evaluated with ImageJ software. During determination of the height of CNT forests this condition has to be taken into account, thus the measured height was divided by sin 35° based on geometric considerations to obtain the actual height.
The diameters of the carbon nanotubes were examined by Transmission Electron Microscopy (TEM, Philips CM 10, 100 keV). In order to prepare the TEM grids, small amount of CNT forests were scraped off the Ti foil with a spatula and was suspended in 1.25 cm3 absolute ethanol. Two to three drops of the suspension were applied on the holey carbon grid (Lacey, CF 200).
The graphitic properties of CNT were analyzed by Raman Spectroscopy (Thermo Scientific DXR Raman microscope, excitation wavelength 532 nm).
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9

Raman Microscopy of Samples

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Raman microscopy measurements (DXR Raman microscope, Thermo Fisher Scientific GmbH, Dreieich, Germany) were performed at 532 nm laser excitation (10 mW) and with a 50 μm slit. The spectra were acquired for 1 s and averaged over ten measurements. The microscopic image and the Raman maps were taken at 100 times magnification with a MPlan N objective (100×/0.90 BD, Olympus SE & Co. KG, Hamburg, Germany).
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10

Multimodal Characterization of Novel Materials

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Field-emission scanning electron microscope (FESEM, Hitachi S-4800, Japan) was applied to analyze the morphology of the samples. The particle size of MPB and MPB-BA was obtained by analyzing the images taken by SEM. High-resolution transmission electron microscope (HRTEM; JEM-2100F, Japan) was applied to measure the morphology and structure of the samples. The crystal structure of the samples was investigated by X-ray diffraction (XRD, Haoyuan Instrument Co., Ltd., China). Fourier transform infrared (FTIR) spectroscopy was examined by an FTIR spectrometer (Thermo Scientific, USA). Raman spectroscopy was detected using DXR Raman microscope (Thermo Scientific, USA) equipped with a DXR 532 nm laser. X-ray photoelectron spectroscopy (XPS, Axis Supra, UK) was used to investigate the elemental chemical states. UV–Vis–NIR absorption was measured using a microplate reader (Bio-TEK Instrument, USA). Brunauer-Emmett-Teller (BET, Micromeritics, 3Flex, USA) method was used to calculate the specific surface area. Nitrogen desorption branch was applied to analyze The pore volume and pore width were calculated according to the Barrett-Joyner-Halenda (BJH) method.
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