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Microlever

Manufactured by Veeco
Sourced in United States, Canada

The Microlever is a lab equipment product manufactured by Veeco. It is a high-precision instrument used for surface analysis and characterization. The core function of the Microlever is to measure and detect small surface features and forces at the micro- and nanoscale level.

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4 protocols using microlever

1

Assessing Ribose-Induced Collagen Mechanics

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Post-glycated 3D collagen matrices were elaborated as explained above using the same conditions of collagen fibers configuration (confocal reflectance imaging). The ribose-induced mechanical alterations in the collagen gels were examined on the 7th, 14th and 21st days by assessing their Young’s elastic modulus, E, which is indicative of gel’s resistance to deformation. E was measured using a stand-alone AFM (Bioscope, Veeco, USA) coupled to an inverted optical microscope as previously described [33 (link)]. Briefly, the AFM measurements were taken using low spring constant cantilevers with pyramidal tips (nominal k = 0.01 N/m) (Microlever, Veeco), which were calibrated using the thermal noise method [34 (link)]. For each gel location, three force vs. piezo displacement curves (F-z curves) were acquired using a moderate loading force (~1 nN). For each gel location, E and the extent of gel indentation (d) were computed as the averages of the values obtained by least-squares fitting of a contact elastic model to each set of three F-z curves, as reported elsewhere [35 (link)]. The same protocol was applied on at least 9 random gel locations. For each treatment, the E data were normalized using the corresponding value obtained from 0 mM ribose gel at the 7th day.
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2

Quantifying Hydrogel Elastic Modulus via AFM

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The Young’s elastic modulus E of 3D collagen-I gels and 2D PAA gels was assessed with a home-made stand-alone AFM adapted to an inverted optical microscope as described in detail elsewhere [27 (link),36 (link)]. In brief, AFM nanoindentation measurements were performed with low spring constant cantilevers with pyramidal tips (nominal k = 0.03 N/m) (Microlever, Veeco, Santa Barbara, CA, USA), which were calibrated using the thermal noise method [36 (link)]. For each gel location, three force-displacement curves (F-z curves) were acquired at a moderate loading force (~1 nN); E of each F-z curve was computed by least-squares fitting of a contact elastic model, and averaged over the three F-z curves [27 (link)]. The same protocol was applied on at least 9 random gel locations to elicit the final E estimate of the hydrogel.
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3

Probing Cell Membrane Puncturing Dynamics

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The cell puncturing experiments were conducted in a JPK NanoWizard® II AFM (JPK Instrumental). A probe with a flat ended silicon nitride tip (Microlevers, Veeco) of diameter of 1, 2 or 3 μm, and a cantilever spring constant of 0.035 N/m, was used. The AFM tip was first made to indent into the cell at a speed of 0.2 μm/s until an indentation depth of 0.4 μm was reached. This was followed by holding for 30 s, and then retraction at a speed of 0.1 μm/s. Size evolution of the hole in the plasma membrane was captured by time-lapse images, taken at a rate of 10 frames/sec, and then quantitatively analyzed by a MATLAB program (see Supplementary Information A and Supplementary Figure 1 for details). All tests were conducted at 25 °C and within 1 hour after the cells were removed from the incubator.
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4

AFM Imaging of Caulobacter Cells

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Caulobacter cells grown overnight in liquid PYE were rinsed in PBS buffer and resuspended in 4% paraformaldehyde (Sigma-Aldrich) solution for 1 hr at room temperature for fixation. Cells were then rinsed in PBS buffer and filtered through polycarbonate porous membrane (Millipore, Billerica, MA, pore size: 3 µm). AFM imaging was performed using a Nanoscope VIII Multimode (Bruker Corporation, Santa Barbara, CA) and oxide-sharpened microfabricated Si3N4 cantilevers with a nominal spring constant of ∼0.01 N/m (Microlevers, Veeco Metrology Group). After filtering the cell culture, the filter was gently rinsed with the buffer, carefully cut (1 cm × 1 cm), attached to a steel sample puck using a small piece of double face adhesive tape, and the mounted sample was transferred into the AFM liquid cell while avoiding dewetting. Images were taken in PBS buffer in contact mode under minimal applied force. Images were analysed using Nanoscope 8.10 software (Bruker, Santa Barbara, CA). Rms (root mean square) roughness values were calculated on 250 × 250 nm2 areas of the high magnification height images subjected to second order filtering.
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