Xflash 5130

The formed particles were observed by field-emission scanning electron microscopy (FESEM, FEI Helios NanoLab G3 UC, ThermoFisher Scientific). An accelerating voltage of 5 kV was used. The EDX spectra recording was also realized by FESEM with a JSM-6700F from JEOL Ltd using a silicon drift detector (SDD) XFlash 5130 from Bruker Nano. In the JSM-6700F, the energy of the exciting electrons was set to 10 keV and the accumulation live time was 200 s in all cases. To prevent charging effects in the SEM, a 5 nm thick carbon layer is deposited on the sample before analysis.
For optical characterization of the mixed particles after laser treatment as well as after the etching procedure, the transmission spectra were determined using a spectrometer (H2000, Ocean Optics) setup with a coupled fiber (wavelength range of 200–1100 nm) under transmitted illumination with a halogen-lamp (400–900 nm emission and illumination diameter 2 mm) and with a UV-vis spectrometer with an integrating sphere of PerkinElmer in the same spectral range (illumination area 1 × 2 mm²). All raw spectra are corrected by the background and light source signal.
The resonance spectra of single pure Au and Ag NPs were calculated depending on different diameters in the wavelength range of 350 to 900 nm using the open source software Mie-Plot (https://www.philiplaven.com/mieplot.htm).

For material characterization scanning electron microscopy (SEM, FE-SEM JSM-6700F; JEOL Ltd., Tokyo, Japan) images and microanalytical measurements (EDX) were performed. The EDX spectra were taken using a Silicon Drift Detector (SDD) XFlash 5130 from BRUKER Nano GmbH, Berlin, Germany. The energy of the exciting electrons was set to 12 keV and the accumulation live time was 500 s. Beyond that X-ray mappings were performed to illustrate the element homogeneity of the fabricated CuI films. In order to prevent charging effects in the SEM, a 5 nm thick carbon layer was deposited on the sample before analysis. The crystalline analysis of the CuI layers on the polyester fiber was investigated by X-ray diffraction (XRD, Panalytical X’Pert Pro) with Cu-Kα_1,2 (Kα1: 1.5406 Å) radiation.