The ejecting speeds of the graphite flake were measured by a home-built Laser Knife-edge equipment. A He-Ne laser beam (JDSU,1125P) was focused on a micrometer-sized area near the edge of the graphite mesa, and an avalanche photodetector (Thorlabs, APD110A/M) was used to detect the variation of the power of the reflected signal. The AFM from Asylum Research (MFP-3DInfinity) was employed to perform the topography and friction measurements under ambient condition (temperature: 20∼25 °C, relative humidity: 20∼30%). EBSD measurements were performed using scanning auger electron spectroscopy (PHI-710, ULVAC-PHI).
Phi 710
Manufactured by Physical Electronics
Sourced in Japan
The PHI 710 is a state-of-the-art X-ray photoelectron spectroscopy (XPS) system designed for materials analysis. It offers high-resolution, quantitative surface analysis capabilities. The system features a focused X-ray source, a high-performance electron energy analyzer, and advanced data acquisition and processing software.
Automatically generated - may contain errors
Lab products found in correlation
Mfp 3d infinity, by Oxford Instruments (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Lfa447, by Netzsch (1 mentions)
Axio vert a1, by Zeiss (1 mentions)
D max 2500 pc, by Rigaku (1 mentions)
Dimension icon, by Bruker (1 mentions)
S 4800, by Hitachi (1 mentions)
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
4 protocols using phi 710
1
Graphite Flake Ejection Dynamics
2
Thermal Conductivity Analysis of Composite Materials
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The microstructure of the composites was observed by an optical microscope (OM, Axiovert A1, Zeiss, Oberkochen, Germany) and a field emission scanning electron microscope (FE-SEM, JSM-7600F, Jeol, Tokyo, Japan). Auger electron spectrometer (AES, PHI 710, Ulvac-Phi, Chigasaki, Japan) and energy dispersion spectra (EDS) attached to the FE-SEM were applied to determine and analyze the elemental composition of the coated graphite. The TC of composite was calculated by the following formula:
where is the thermal diffusion coefficient of the composite measured at room temperature by a laser flash thermal analyzer (LFA-447, Netzsch, Selb, Germany). To meet the measurement requirements of thickness, the sample in size of 4 × 10 mm was stacked to about 10 mm. is specific heat of the composite, which was calculated according to rule of mixture:
where , is specific heat and , is the volume fraction of aluminum and graphite, respectively. Composite density was measured using the Archimedes principle.
where is the thermal diffusion coefficient of the composite measured at room temperature by a laser flash thermal analyzer (LFA-447, Netzsch, Selb, Germany). To meet the measurement requirements of thickness, the sample in size of 4 × 10 mm was stacked to about 10 mm. is specific heat of the composite, which was calculated according to rule of mixture:
where , is specific heat and , is the volume fraction of aluminum and graphite, respectively. Composite density was measured using the Archimedes principle.
3
Comprehensive Graphene Characterization Techniques
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Graphene characterization. The OM was conducted on a Nikon Olympus LV100ND system. The X-ray diffraction (XRD) was carried out using an X-ray powder diffractometer (Rigaku D/MAX-PC 2500). The SEM images were obtained on a Hitachi S4800 field-emission scanning electron microscope. Electron backscattering diffraction (EBSD) measurements were carried out on ULVAC-PHI (PHI 710) Auger system equipped with the EBSD probe (EDAX, DigView). EBSD test was operated at voltage of 10 kV and current of 10 nA. The spot size was 20 nm and the angular resolution was of the order of 0.1°. AFM image was carried out on a Bruker Dimension Icon with a Nanoscope V controller using the ScanAsyst mode.
PEEM and -LEED were conducted in an Elmitec LEEM-III system (base pressure 10 10 Torr). The selected area for LEED is about 2 m and the electron energy was fixed to 50 eV.
PEEM and -LEED were conducted in an Elmitec LEEM-III system (base pressure 10 10 Torr). The selected area for LEED is about 2 m and the electron energy was fixed to 50 eV.
4
Surface Characterization of Cultured Samples
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The coupons were removed from the vials in the anaerobic chamber after 7 days of coculture, washed with deionized water and dried. The X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) experiments were conducted using an XPS microprobe (EscaLab250Xi, Thermo, USA) and a scanning Auger microscope (PHI 710, ULVAC-PHI, Japanese), respectively. For XPS measurement, a monochromatic AI Kα X-ray source (1500 eV energy and 150 W power) was used within 50 eV pass energy with a step size of 0.2 eV.
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