Ultima ivx ray diffraction xrd system

Manufactured by Rigaku

The Ultima IVX-ray diffraction (XRD) System is a versatile and powerful instrument designed for materials analysis. It utilizes X-ray diffraction technology to provide detailed information about the crystallographic structure, phase composition, and other properties of a wide range of materials. The Ultima IVX system is capable of performing a variety of XRD analyses, delivering accurate and reliable data to support research, development, and quality control applications.

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2 protocols using ultima ivx ray diffraction xrd system

Powder X-ray Diffraction Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols

A Rigaku Ultima IV
X-ray diffraction (XRD) System equipped with standard attachment (Cu
Kα radiation, λ = 1.54 Å) was used to collect powder
X-ray diffraction data. Over the 2θ range of 2–45°
utilizing a 0.02° incremental step, data were collected utilizing
a scanning speed of 5° per minute. Slit heights were set as follows:
divergence slit: 2/3°; divergence height limiting slit: 10 mm;
scattering slit: 2/3°; receiving slit: 0.3mm. Mercury 4.0 2021.2.0
visualization and analysis of crystal structures software suite was
used to simulate PXRD patterns (Step: 0.02°, full width at half-maximum
of 0.1°).^{15 (link)} Maximum count values were
normalized to 10,000 counts.

Angevine D.J., Camacho K.J., Zhang X., Rzayev J, & Benedict J.B. (2023). Enhancing the Stability of Nicotine via Crystallization Using Enantiopure Tartaric Acid Salt Formers. ACS Omega, 8(17), 15535-15542.

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Powder X-ray Diffraction Analysis Protocol

Check if the same lab product or an alternative is used in the 5 most similar protocols

Powder X-ray diffraction data were collected using a Rigaku Ultima IV X-ray Diffraction (XRD) System equipped with standard attachment (CuKα radiation, λ = 1.54 Å). Data collection was performed over the 2θ range from 2° to 45° utilizing a 0.02° incremental step. A scanning speed of 5° per minute was utilized. Slit heights were set as follows: divergence slit: 2/3°; divergence height limiting slit: 10mm; scattering slit: 2/3°; receiving slit: 0.3mm. PXRD patterns were simulated using the Mercury 4.0 2021.2.0 visualization and analysis of crystal structures software suite (Clare F. Macrae, Cambridge, UK) [37 (link)]. A 0.02° step was utilized for the simulated PXRD pattern along with a full width half max of 0.1. All PXRD patterns were normalized to a maximum intensity of 10,000 counts.

Angevine D.J., Camacho K.J., Rzayev J, & Benedict J.B. (2022). Enhancing the Photo and Thermal Stability of Nicotine through Crystal Engineering with Gentisic Acid. Molecules, 27(20), 6853.

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