The UV-vis diffuse reflectance spectra of rutile RuxTi1-xO2 were obtained by using a Jasco UV-Vis V-550 spectrophotometer in the wavelength range from 200 to 900 nm with an integrating sphere assembly. The sample was diluted with MgO (ratio 1:6) and then mechanically mixed. The UV-vis absorption was transformed according to the Kubelka Munk function, , for infinite thick samples. The sample surface elements and their oxidation states were analyzed by Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) system with Al K-alfa radiation. The Raman spectra of samples were registered using a DXR Raman Microscope from Thermo Scientific. The morphology of the samples was characterized by transmission electron microscope Tecnai™ G2 F20 TWIN Cryo-TEM, FEI Company™, through bright field (BF-TEM) and scanning transmission electron microscopy analyses. The TEM was operated under an acceleration voltage of 200 kV. A small drop of well-dispersed sample, ultrasonicated for 5 minutes, was put on a carbon film copper grid and then, visualized on TEM.
Tecnai g2 f20 twin cryo tem
The Tecnai™ G2 F20 TWIN Cryo-TEM is a high-resolution transmission electron microscope designed for cryogenic sample imaging. It provides advanced electron optics and a unique TWIN objective lens system to enable high-contrast, low-dose imaging of sensitive biological specimens in their native hydrated state.
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6 protocols using tecnai g2 f20 twin cryo tem
Characterization of Ru-doped TiO2 Nanomaterials
The UV-vis diffuse reflectance spectra of rutile RuxTi1-xO2 were obtained by using a Jasco UV-Vis V-550 spectrophotometer in the wavelength range from 200 to 900 nm with an integrating sphere assembly. The sample was diluted with MgO (ratio 1:6) and then mechanically mixed. The UV-vis absorption was transformed according to the Kubelka Munk function, , for infinite thick samples. The sample surface elements and their oxidation states were analyzed by Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) system with Al K-alfa radiation. The Raman spectra of samples were registered using a DXR Raman Microscope from Thermo Scientific. The morphology of the samples was characterized by transmission electron microscope Tecnai™ G2 F20 TWIN Cryo-TEM, FEI Company™, through bright field (BF-TEM) and scanning transmission electron microscopy analyses. The TEM was operated under an acceleration voltage of 200 kV. A small drop of well-dispersed sample, ultrasonicated for 5 minutes, was put on a carbon film copper grid and then, visualized on TEM.
Nanoparticle Morphological Analysis
Morphological Analysis of Cu-Au NPs
Synthesis and Characterization of Silicon Quantum Dots
The SiQDs were analyzed by scanning electron microscopy (SEM) on a Zeiss Auriga microscope (Carl Zeiss, Jena, Germany), acquiring the images at a voltage of 5 kV, and in a bright-field mode of transmission electron microscopy (TEM) using a Tecnai F20 G2 TWIN Cryo-TEM (FEI, Hillsboro, OR, USA) at an acceleration voltage of 200 kV.
The measurement of the hydrodynamic size, polydispersity index, and zeta potential of SiQDs dispersed in saline was performed in triplicate at 25 °C using a refractive index of 1.52 on a Malvern Nano-ZS instrument (Malvern Instruments, Malvern, Worcestershire, UK). The absorbance and emission spectra of SiQDs were recorded in 0.9% NaCl solution using the FlexStation 3 reader (Molecular Devices, San Jose, CA, USA).
Cryo-TEM Analysis of 3D Printed Composites
Biogenic Selenium Nanoparticles Characterization
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