Tecnai g2 f30
The Tecnai G2 F30 is a high-performance transmission electron microscope (TEM) designed for advanced materials characterization. It features a field emission gun (FEG) electron source and a high-resolution imaging system, enabling detailed structural and compositional analysis of a wide range of samples.
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291 protocols using tecnai g2 f30
Comprehensive Characterization of FR-MoS2/PPy Composite
High-Resolution TEM Imaging Setup
Characterization of Ag/TiO2 Nanocomposites
Characterization of Nanostructured Hydroxyapatite
Comprehensive Characterization of Novel Materials
Hydrothermal Synthesis of MoS2 Nanosheets
X-ray diffraction (XRD, X'Pert PRO PHILIPS with Cu Kα radiation) was employed to study the crystal structure. The morphology of the samples was obtained by using the high-resolution transmission electron microscopy (HRTEM, TecnaiTM G2 F30, FEI, Hillsboro, OR, USA). X-ray photoelectron spectroscopy (XPS, Kratos Axis Ultra, Manchester, UK) was utilized to determine the bonding characteristics of the samples. The composition was confirmed by an inductively coupled plasma atomic emission spectrometer (ICP, ER/S). The measurements of magnetic properties were made using the Quantum Design MPMS magnetometer based on superconducting quantum interference device (SQUID).
Comprehensive Characterization of Magnetic Samples
Synthesis and Characterization of γ-Fe2O3 Nanoparticles
The crystal structure of samples were measured by X-ray diffraction (XRD, PANalytical X’Pert) equipped with Cu-Kα radiation (λ = 1.5406 Å). The morphology of all samples was observed by using field emission scanning electron microscopy (FESEM, Hitachi S-4800) and transmission electron microscopy (TEM, TecnaiTM G2 F30, FEI) equipped with an energy-dispersive spectrometer (EDS). The X-ray photoelectron spectroscopy (XPS, PHI-5702, Physical Electronics) were performed using a monochromatic Al-Kα irradiation and a charge neutralizer. All binding energies were referred to the C1 s peak at 284.6 eV of the surface adventitious carbon. The magnetic properties of the samples were measured by a vibrating sample magnetometer (VSM, Lakeshore 7304). The measurement process of surface areas and photocatalytic activity of the sample were shown in the Supporting Information (SI).
Multimodal Characterization of Nanomaterials
Characterization of SrFe12O19 Nanoribbons
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