X-ray diffraction (XRD) was conducted with a Rigaku D/max-TTR-III diffractometer utilizing Cu-Ka radiation (λ = 0.15405 nm). Transmission electron microscopy images were captured on an FEI Tecnai G2S-Twin with a field emission gun operating at 200 kV. A Hitachi U-3100 spectrophotometer was used to characterize the UV-visible spectra of the samples. The solution of the UCNPs@mSiO2-Ce6 (1 mg/mL) was oscillated in the constant temperature water bath oscillator, and the ultraviolet absorption spectra at 650 nm was measured before and after centrifugation (2000 rpm, 5 mins) once a day to evaluate the stability of Ce6. Fourier transform infrared (FT-IR) spectroscopy spectra were got on a Perkin-Elmer 580BIR spectrophotometer utilizing the KBr pellet as the background. The fluorescence life curves of the samples were recorded and measured using the Tektronix MSO/DPO4000 oscilloscope. Upconversion emission spectra were tested on a R955 Hamamatsu photomultiplier tube, from 400 to 800 nm, the 808 nm laser diode module (K98D08M-30W, China) was used as the irradiation source. The images of confocal microscopy were recorded by a Leica TCS SP8. All the measurements were performed at room temperature.
D max ttr 3 diffractometer
Manufactured by Rigaku
Sourced in Japan
The D/max TTR-III is a versatile X-ray diffractometer designed for a wide range of materials analysis applications. It features a high-intensity rotating anode X-ray source, a goniometer for sample positioning, and advanced detection systems for accurate data collection. The core function of the D/max TTR-III is to perform X-ray diffraction analysis, providing structural and phase information about crystalline materials.
Automatically generated - may contain errors
Lab products found in correlation
Tecnai g2 s twin, by Thermo Fisher Scientific (4 mentions)
Asap tristar 2 3020, by Micromeritics (3 mentions)
Jsm 6480a, by Thermo Fisher Scientific (2 mentions)
Tcs sp8, by Leica (1 mentions)
U 3100 spectrophotometer, by Hitachi (1 mentions)
580b ir spectrophotometer, by PerkinElmer (1 mentions)
Tecnai tf30, by Thermo Fisher Scientific (1 mentions)
580bir spectrophotometer, by Bruker (1 mentions)
Fls980, by Edinburgh Instruments (1 mentions)
Hrtem, by JEOL (1 mentions)
Cu kα radiation, by Rigaku (1 mentions)
Jsm 2100f, by JEOL (1 mentions)
Jsm 6480a, by JEOL (1 mentions)
7 protocols using d max ttr 3 diffractometer
1
Multimodal Characterization of UCNPs@mSiO2-Ce6
2
Comprehensive Structural Characterization of Materials
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Crystalline structure, the morphology, and chemical composition of the samples were investigated by powder X-ray diffraction (XRD) (Rigaku D/max TTR-III diffractometer with graphite monochromatized Cu Kα radiation (λ = 0.15405 nm)), scanning electron microscope (SEM, JSM-6480A), transmission electron microscopy (TEM, FEI Tecnai G2 S-Twin), high-resolution transmission electron microscopy (HRTEM), and the X-ray photoelectron spectra XPS (VG ESCALAB MK II electron energy spectrometer using Mg KR (1253.6 eV) as the X-ray excitation source). Raman spectra were conducted on a confocal laser microRaman spectrometer (LABRAM-HR, JY Co.), and N2 adsorption/desorption isotherms were measured from Micromeritics ASAP Tristar II 3020 apparatus. The electrochemical properties were carried out by a CHI 666D electrochemical workstation. All the tests were carried out at room temperature.
3
Comprehensive Material Characterization
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Powder X-ray diffraction (XRD) measurements were determined on a Rigaku D/max TTR-III diffractometer in the 2θ range from 20° to 80°, using Cu Ka radiation (λ = 0.15405 nm). Fourier-transform Infrared (FTIR) spectra were obtained on a Vertex Perkin-Elmer 580B IR spectrophotometer (Bruker) with the KBr pellet technique. Transmission electron microscopy (TEM) images were collected on a FEI Tecnai TF30 apparatus. The powder was ultrasonically dispersed in ethanol before being deposited on the carbon-coated copper grid for observation. N2 physisorption isotherms were obtained on a BeiShiDe 3H-2000PS2 apparatus. The sample was degassed in vacuum at 300 °C for 5 h before measurement. The surface area was calculated with the Brunauer–Emmett–Teller (BET) method and the pore size distribution was calculated by the Nonlocal density functional theory (NLDFT) method. X-ray photoelectron spectra (XPS) were recorded on a VG ESCALAB MK II apparatus using Mg KR (1253.6 eV) as the X-ray excitation source. The binding energy was calibrated using the C1s signal of adventitious carbon at 284.6 eV.
4
Comprehensive Characterization of Material Samples
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Crystalline structure, the morphology, and chemical composition of the samples were investigated by powder X-ray diffraction (XRD) (Rigaku D/max TTR-III diffractometer with graphite monochromatized Cu Kα radiation (λ = 0.15405 nm)), scanning electron microscope (SEM, JSM-6480A), transmission electron microscopy (TEM, FEI Tecnai G2 S-Twin), high-resolution transmission electron microscopy (HRTEM), and the X-ray photoelectron spectra XPS (VG ESCALAB MK II electron energy spectrometer using Mg KR (1253.6 eV) as the X-ray excitation source). Raman spectra were conducted on a confocal laser microRaman spectrometer (LABRAM-HR, JY Co.), and N2 adsorption/desorption isotherms were measured from Micromeritics ASAP Tristar II 3020 apparatus. The electrochemical properties were carried out by a CHI 666D electrochemical workstation.
5
Comprehensive Characterization of Materials by XRD, TEM, and Spectroscopy
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The X-ray diffraction (XRD) pattern was measured using a Rigaku D/max TTR-III diffractometer with graphite monochromatized Cu Kα radiation (λ = 0.15405 nm), and the scanning rate is 15° min−1 with 2θ range between 10° and 80°. The morphologies of the samples were examined by transmission electron microscopy (TEM, FEI Tecnai G2 S-Twin). Nitrogen adsorption/desorption isotherms were acquired on a Micromeritics ASAP Tristar II 3020 apparatus, and the pore size distribution was calculated by the Brunauer-Emmett-Teller (BET) method. UCL spectra were obtained using a 980 nm laser diode Module (MDL-III-980-2W) and recorded on a spectrofluorometer (Edinburgh FLS 980). The ultraviolet visible (UV-vis) absorbance spectra of the solutions were measured by a UV-1601 spectrophotometer. All the tests were carried out at room temperature, and all the methods were performed in accordance with the relevant guidelines and regulations of Harbin Engineering University and SUNY at Buffalo.
6
Characterization of Hollow Spherical Nanostructures
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The dimensions and morphologies were examined using scanning electron microscopy (SEM, JSM-2100F, JEOL, Tokyo, Japan. The crystallographic structures were investigated by powder XRD (X-ray diffraction) measurements on a Rigaku D/max-TTR III diffractometer with Cu Kα radiation (Rigaku Corporation, Shibuya-ku, Japan), 40 kV, 200 mA. The nanostructures of hollow spherical samples were characterized by high-resolution transmission electron microscopy (HRTEM, JEOL, Tokyo, Japan, 2010).
7
Fabrication and Characterization of Li-Pb Alloys
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The Li–Pb alloys were fabricated by potentiostatic and galvanostatic electrolysis, respectively. After electrolysis, the cathodic deposits were washed with ethylene oxide (99.7%) to remove solidified salt attached to their surface. These deposits were analyzed by X-ray diffraction (XRD, Rigaku D/max-TTR-III diffractometer) by Cu-Kα radiation at 40 kV, 150 mA and scanning electronic microscopy (SEM, JSM-6480A; JEOL Co., Ltd) to characterize the composition and morphology of Li–Pb alloys.
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