Nanolab 660

Manufactured by Thermo Fisher Scientific

Sourced in United States

The NanoLab 660 is a high-performance electron microscope designed for nanoscale analysis and imaging. It features advanced electron optics and a sophisticated control system to provide users with reliable and precise results.

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Lab products found in correlation

X maxn 80 detector, by Oxford Instruments (2 mentions) Ultracut uct ultramicrotome, by Leica (1 mentions) E 1010, by Hitachi (1 mentions) Dsa100, by Krüss (1 mentions) K alpha x ray photoelectron spectroscopy xps, by Thermo Fisher Scientific (1 mentions) Alpha spectrometer, by Bruker (1 mentions) Ppp rt nchr, by Nanosensors (1 mentions) Vt1200, by Leica (1 mentions) Lsm 880, by Zeiss (1 mentions) Ultracut uc7, by Leica (1 mentions) Multimode 8, by Bruker (1 mentions) Dxr raman microscope, by Thermo Fisher Scientific (1 mentions) Jem 2800f, by JEOL (1 mentions)

Close spelling variants of this product

Helios NanoLab 660 (19 citations) NanoLab 660 DualBeam (7 citations) Helios NanoLab™ 660 FIBSEM (5 citations) Helios NanoLab 660 G3 UC (4 citations) Helios Nanolab™ 660 DualBeam™) (3 citations) Helios Nanolab 660 DualBeam Microscope (3 citations) FEI Helios NanoLab 660 (3 citations) Helios NanoLab 660 Scanning Electron Microscope (3 citations) NanoLab 660 Dual (2 citations) Nanolab 660 DualBeam Microscope (2 citations)

16 protocols using nanolab 660

Nanoscale Analysis of Fe/Pd Nanoparticles in Membranes

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The size and distribution of the Fe/Pd nanoparticles were studied both on the surface and inside the membrane pores after preparation of a lamella using FIB-SEM (FEI Helios Nanolab 660) analysis. Following surface imaging of the region of interest, a lamella was lifted out of the membrane sample and its thickness gradually reduced using FIB until it was transparent. The specimen was then imaged via scanning transmission electron microscopy (STEM) in the FIB-SEM. Following this treatment, the Fe/Pd nanoparticles inside the membrane pores could then be directly observed in transmission.
The elemental composition of the particles was determined by energy dispersive X-ray spectroscopy (EDX, Oxford Instruments X-Max^N 80 detector) on the lamella. Their reduced thickness decreased scattering of the beam and optimized EDX lateral resolution. Although individual nanoparticles could not be distinguished during EDX elemental mapping, regions where particles agglomerated were identified. Elemental composition of this agglomerate was possible, and only Fe and Pd were considered during this analysis. Other observed elements such as the C, H, F, O (membrane elements), Pt (coating), Ga (beam) and Cu (holder) were ignored to clearly analyze Fe and Pd composition.

Wan H., Briot N.J., Saad A., Ormsbee L, & Bhattacharyya D. (2017). Pore Functionalized PVDF Membranes with In-Situ Synthesized Metal Nanoparticles: Material Characterization, and Toxic Organic Degradation. Journal of membrane science, 530, 147-157.

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FIB/SEM Imaging of Dorsolateral Striatum

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The striatal tissue surface was exposed using a Leica Ultracut UCT ultramicrotome. The block was then placed in a metal stub and sputter coated with gold-palladium to prevent specimen charging E1010 (E1010; Hitachi). Serial FIB/SEM images at 40–50 nm increments were acquired from the dorsolateral striatum on a Helios Nanolab 660 FIB/SEM using Auto Slice & View G3 software (FEI) to automate the serial milling and imaging process. The surface of the brain block was milled by the thermal energy produced by 0.77 nA of gallium (Ga) ion beam current that was accelerated at a voltage of 30 kV. The electron beam had a dwell time of 5 µs. The acceleration voltage in the backscattered electron detector was set to 2.0 kV with 0.8 nA. Images were obtained at 15,000× magnification covering a distance of 13.82 µm in the horizontal direction and 11.69 µm in vertical direction at a resolution of 4.5 nm/pixel. The lateral resolution (x, y) and axial resolution (z, section thickness) used in our study is within the typical range used for electron microscopic (EM) imaging of neuronal structures. At this resolution, we can clearly resolve synaptic vesicles, postsynaptic density (PSD), small spines and thin axons.

Parajuli L.K., Wako K., Maruo S., Kakuta S., Taguchi T., Ikuno M., Yamakado H., Takahashi R, & Koike M. (2020). Developmental Changes in Dendritic Spine Morphology in the Striatum and Their Alteration in an A53T α-Synuclein Transgenic Mouse Model of Parkinson’s Disease. eNeuro, 7(4), ENEURO.0072-20.2020.

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Evaluating Surface Morphologies and Composition

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The surface morphologies of the porous support structures and the polyamide film were evaluated using a field emission scanning electron microscope (FESEM) (FEI Helios Nanolab 660). A K-alpha X-ray Photoelectron Spectroscopy (XPS) from Thermo Scientific was used for measuring the atomic composition of both the surface and the depth profile. More details on these techniques are provided in the Supporting Information. Hydrophobicity was studied by measuring the water contact angle using a drop shape analyzer, Kruss DSA100, by the sessile drop technique.

Léniz-Pizarro F., Vogler R.J., Sandman P., Harris N., Ormsbee L.E., Liu C, & Bhattacharyya D. (2022). Dual-Functional Nanofiltration and Adsorptive Membranes for PFAS and Organics Separation from Water. ACS ES&T water, 2(5), 863-872.

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Characterization of Ion Exchangers and Polymers

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The structure of the obtained ion exchangers (from IE-0 to IE-3) and polymer materials (from PM-0 to PM-3) before and after sorption processes was investigated by Fourier transform infrared—attenuated total reflectance (FTIR-ATR) spectroscopy, scanning electron microscopy—energy-dispersive spectroscopy (SEM-EDS), and atomic force microscopy (AFM). The FTIR spectra were obtained on a Bruker ALPHA spectrometer at a wavenumber range of 350–2000 cm⁻¹. The SEM-EDS were obtained on a scanning electron microscope with focus ion beam (FEI Helios Nanolab 660). The AFM were made using atomic force microscope (Agilent 5500).
The thickness of sorption materials was determined after measuring the test samples with the manual precision thickness gauge Panametrics® Magna-Mike® 8500 (San Diego, CA, USA).

Witt K., Kaczorowska M.A, & Bożejewicz D. (2024). Efficient, fast, simple, and eco-friendly methods for separation of toxic chromium(VI) ions based on ion exchangers and polymer materials impregnated with Cyphos IL 101, Cyphos IL 104, or D2EHPA. Environmental Science and Pollution Research International, 31(5), 7977-7993.

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Monolayer WS2 Triangles Imaging

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High-quality field-emission scanning electron microscopy images of monolayer WS₂ triangles on SiO₂ were acquired in a dual-beam microscope (FEI Helios NanoLab 660). Enhanced contrast was achieved by using a low acceleration voltage (2 kV) and collecting the secondary electrons with a through-lens detector instead of an Everhart-Thornley detector.

Carozo V., Wang Y., Fujisawa K., Carvalho B.R., McCreary A., Feng S., Lin Z., Zhou C., Perea-López N., Elías A.L., Kabius B., Crespi V.H, & Terrones M. (2017). Optical identification of sulfur vacancies: Bound excitons at the edges of monolayer tungsten disulfide. Science Advances, 3(4), e1602813.

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In-situ Cleaning with FIB/SEM

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A FEI Helios NanoLab 660 instrument dualbeam FIB/SEM was used for SEM/STEM imaging and in situ cleaning. The cleaning was performed with 2 MM3A micromanipulators from Kleindiek equipped with commercial W tips (tip diameter of around 100 nm). The microscope was operated at 2 kV for surface-sensitive SE imaging and 20–30 kV for STEM imaging.

Schweizer P., Dolle C., Dasler D., Abellán G., Hauke F., Hirsch A, & Spiecker E. (2020). Mechanical cleaning of graphene using in situ electron microscopy. Nature Communications, 11, 1743.

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Characterization of Gold Nanoslit Arrays

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Figure 1a shows the optical picture of a gold capped EC-SPR sensor. The surface morphology of the gold nanoslit arrays was determined using a Helios NanoLab 660 focused ion beam scanning electron microscope (FIB-SEM) (FEI, Hillsboro, OR, USA). The characterized width using SEM for the capped gold nanoslit arrays is about 75.0 nm and the outside surface is about 417.3 nm (Figure 1b). The depth of the gold nanostructures on the COP substrate was analyzed by atomic force microscopy line scan (BioAFM NanoWizard 3, JPK, Berlin, Germany), operated in AC mode under dry conditions and using highly doped silicon to dissipate static charge tips (PPP-RT-NCHR, Nanosensors, Neuchatel, Switzerland) with a spring constant of 42 N/m and a resonant frequency of 330 kHz. Figure 1c shows the cross-sectional profile of template-stripped nanostructures. The measured height of capped gold nanoslit arrays is about 47 nm.

Chen C.C., Lo S.C, & Wei P.K. (2021). Combination of Capped Gold Nanoslit Array and Electrochemistry for Sensitive Aqueous Mercuric Ions Detection. Nanomaterials, 12(1), 88.

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Ultrastructural Localization of PK-LC3B

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The precise localization of PK-LC3B was analyzed following a previously described method^{33 (link)}. Briefly, after perfusion fixation as described above, the specimens were cut into 30 µm sections using a vibratome (Leica, VT1200S), and were stained with DAPI for 1 hour at room temperature. After washing with PBS, sections were mounted on a grid glass-bottom dish (Matsunami - #D11130H), and then were observed using a confocal laser microscope (Zeiss, LSM880). Sections were postfixed with 2% glutaraldehyde-1% OsO₄, dehydrated, and embedded in Epon 812 epoxy resin (Oken shoji). Thin sections were cut at 80 nm with an ultramicrotome (Leica Ultracut UC7, Leica microsystems), stained with uranyl acetate and lead citrate, and observed with a scanning electron microscope (SEM) (Helios NanoLab 660, FEI). To determine the perikaryal site of Purkinje cells that corresponded to mKate2 (red) fluorescent sites, positive fluorescent sites in a Purkinje cell were superimposed on the SEM figure of the corresponding cell, and exact organelles were identified in the SEM figure.

Oliva Trejo J.A., Tanida I., Suzuki C., Kakuta S., Tada N, & Uchiyama Y. (2020). Characterization of starvation-induced autophagy in cerebellar Purkinje cells of pHluorin-mKate2-human LC3B transgenic mice. Scientific Reports, 10, 9643.

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In Situ SEM Manipulation of Dislocations

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A FEI Helios NanoLab 660 instrument equipped with a STEM III detector and the capacity to fit up to four micromanipulators (Kleindiek MM3A) inside the chamber was used for SEM imaging and in situ manipulation of dislocations. For manipulation experiments 2 or 3, MM3A manipulators were attached to the door of the microscope. The manipulators were equipped with commercial W tips (apex size of ca. 100 nm) or with focused ion beam–milled fine tips with apex sizes of ca. 25 nm. The microscope was operated at 20 kV in immersion mode. For tSEM imaging, the segmented STEM detector was read out according to the optimized contrast, as shown in fig. S2.

Schweizer P., Dolle C, & Spiecker E. (2018). In situ manipulation and switching of dislocations in bilayer graphene. Science Advances, 4(8), eaat4712.

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Comprehensive Characterization of CrCl3 Flakes

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The thickness and surface morphology of as‐grown CrCl₃ flakes were characterized by AFM (Bruker Multimode 8) with the tapping mode. SEM was performed using an FEI Helios Nanolab 660 with a field emission gun at 2 kV. The chemical element analysis was conducted by EDS using the point and mapping modes in SEM. HRTEM studies were performed in an FEI Tecnai Osiris electron microscope operated at 200 kV. Nonpolarized Raman spectra were collected by a Thermo Scientific DXR Raman microscope with a 532 nm laser, a 100× objective, exposure time of 30 s, 0.2 mW laser power, and a 900 lines mm⁻¹ grating. Polarized Raman spectra were recorded using a Harina/Princeton Acton 7500i/spectrometers equipped with a 532 nm laser, with a 50× objective, 0.2 mW incident laser power, integration time of 20 min, and 1800 lines mm⁻¹ grating. The excitation laser and collected Raman signal were collinearly polarized. For the angular dependence measurements, the angle step was 5° for a half‐wave plate, which was 10° in the polar map. For SEM, TEM, and Raman characterizations, the CrCl₃ flakes were transferred onto Au‐coated (10 nm) SiO₂/Si substrates (SEM and Raman) and TEM chips (Silicon Nitride Support Film, 50 nm with 0.5 × 0.5 mm Window) using the all‐dry stamping transfer technique.

Wang J., Ahmadi Z., Lujan D., Choe J., Taniguchi T., Watanabe K., Li X., Shield J.E, & Hong X. (2022). Physical Vapor Transport Growth of Antiferromagnetic CrCl3 Flakes Down to Monolayer Thickness. Advanced Science, 10(3), 2203548.

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