Cubix diffractometer

Manufactured by Malvern Panalytical

The CubiX diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It provides precise and reliable measurements of the crystal structure and composition of solid materials. The CubiX diffractometer utilizes a fixed X-ray source and a goniometer to rotate the sample and collect diffraction patterns, which can be used to identify unknown materials or characterize the properties of crystalline samples.

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Lab products found in correlation

715 es icp optical emission spectrometer, by Agilent Technologies (1 mentions) Ea3000 chns analyzer, by Eurovector (1 mentions) Ultra 55 microscope, by Zeiss (1 mentions) E4980a precision lcr meter, by Agilent Technologies (1 mentions) Concept 40, by Novocontrol (1 mentions) 2100f microscope, by JEOL (1 mentions) Ultra 55 fesem, by Zeiss (1 mentions)

4 protocols using cubix diffractometer

Comprehensive Characterization of Materials

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Powder X-ray diffraction (PXRD) measurements were performed using a Panalytical CubiX diffractometer operating at 40 kV and 35 mA, and using Cu Kα radiation (λ = 0.1542 nm).
Chemical analyses were carried out in a Varian 715-ES ICP-Optical Emission spectrometer, after solid dissolution in H₂SO₄/H₂O₂ aqueous solution. Elemental analyses were performed by combustion analysis using a Eurovector EA 3000 CHNS analyzer and sulphanilamide as reference.
The morphology of the samples was studied by field emission scanning electron microscopy (FESEM) using a ZEISS Ultra-55 microscope.
The adsorption and desorption curve of N₂ was measured at 77 K in an ASAP2420 Micromeritics device. The specific surface areas were calculated by the Brunauer–Emmet–Teller (BET) method following Rouquerol's criterion.
Thermogravimetric and thermal differential analysis (TG-DTG) were conducted in air stream with a NETZSCH STA 449F3 STA449F3A-1625-M analyzer (temperature ramp: 25 °C/10.0 (°C/min))/800 °C).
Infrared (FTIR) spectra were recorded in a PIS 100 spectrometer. The solid samples, mixed with KBr, were pressed into a pellet.

Rojas-Buzo S., Bohigues B., Lopes C.W., Meira D.M., Boronat M., Moliner M, & Corma A. (2021). Tailoring Lewis/Brønsted acid properties of MOF nodes via hydrothermal and solvothermal synthesis: simple approach with exceptional catalytic implications. Chemical Science, 12(29), 10106-10115.

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Comprehensive Characterization of Ferroelectric Materials

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The phase composition and crystal structure was investigated by X-ray diffraction (XRD) using a CubiX diffractometer (Panalytical, The Netherlands) with Cu Kα radiation (30 kV, 30 mA). The lattice parameters were determined using FullProf 2000. For dielectric measurements, Ag-Pd electrodes were deposited on the plane-parallel polished surfaces of the disks followed by annealing in air at 500 °C for 12 h. The dielectric properties were measured by an impedance bridge E4980A Precision LCR Meter (Agilent, Santa Clara, CA) and a dielectric spectrometer CONCEPT40 (Novocontrol Technologies, Hundsangen, Germany) in the temperature range −150–150 °C at 10²–10⁶ Hz. Polarization – electric field ferroelectric loops were recorded at room temperature on the electroded ceramics immersed in transformer oil bath by a Sawyer–Tower modified circuit fed by triangular high voltage wave (frequency: 10 Hz) by using a TREK amplifier.

Canu G., Bottaro G., Buscaglia M.T., Costa C., Condurache O., Curecheriu L., Mitoseriu L., Buscaglia V, & Armelao L. (2019). Ferroelectric order driven Eu3+ photoluminescence in BaZrxTi1−xO3 perovskite. Scientific Reports, 9, 6441.

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Multimodal Characterization of Nanomaterials

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The metal content in the samples and metal leaching were analyzed by inductively coupled plasma atomic emission spectroscopy (ICP-AES) using a Varian 715-ES.
Samples for electron microscopy studies were prepared by dropping the suspension of the powder sample using CH2Cl2 as the solvent directly onto holeycarbon coated copper grids. All the measurements were performed in a JEOL 2100F microscope operating at 200 kV both in transmission (TEM) and in scanning transmission modes (STEM). STEM images were obtained using a high angle annular dark-field detector (HAADF), which allows Z-contrast imaging.
Field emission scanning electron microscopy (FESEM) measurement was performed with a ZEISS Ultra 55 FESEM. The solid powder sample was adsorbed on conductive carbon tape.
Powder X-ray diffraction (XRD) were performed using a PAnalytical CubiX diffractometer using Cu Kα radiation and a multisampling handler.
Raman spectra were recorded at ambient temperature with a 785 nm HPNIR excitation laser on a Renishaw Raman spectrometer "Reflex" equipped with an Accepted Article  Olympus microscope and a CCD detector. The laser power on the sample was 15 mW and 20 acquisitions were taken for each spectrum.

Arias K.S., Carceller J.M., Climent M.J., Corma A, & Iborra S. (2020). Chemoenzymatic Synthesis of 5-Hydroxymethylfurfural (HMF)-Derived Plasticizers by Coupling HMF Reduction with Enzymatic Esterification. ChemSusChem, 13(7).

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X-ray Powder Diffraction Analysis Protocol

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XRD patterns analysis were obtained by X-ray powder diffraction (XRD) with a Panalytical CUBIX diffractometer using monochromatic Cu Kα radiation (λ= 0.15417nm) at 45kV and 40mA. The angle (2θ) was measured in a scan range between 2.00° and 90.03° in steps of 0.0401° with a counting time of 34.92s.

Vidal J.D., Climent M.J., Corma A., Concepcion D.P, & Iborra S. (2017). One-Pot Selective Catalytic Synthesis of Pyrrolidone Derivatives from Ethyl Levulinate and Nitro Compounds. ChemSusChem, 10(1).

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