Scanning electron microscopy (SEM) was used to observe the microstructure of the patterned bilayer film. Firstly, the samples tested were sputter-coated with gold (JEOL; operating settings) for 35 s. We then used a JSM-7600F Schottky field-emission scanning electron microscope (JEOL) to take the SEM images at an accelerating 5.00-kV voltage.
Jsm 7600f schottky field emission scanning electron microscope
Manufactured by JEOL
Sourced in Japan, United States
The JSM-7600F is a Schottky field emission scanning electron microscope (SEM) manufactured by JEOL. It provides high-resolution imaging and analytical capabilities for a wide range of materials and applications. The microscope utilizes a Schottky field emission gun to produce a high-brightness electron beam, enabling high-resolution imaging at low accelerating voltages.
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Lab products found in correlation
Smart coater, by JEOL (1 mentions)
Arm200f, by JEOL (1 mentions)
Axis supra spectrometer, by Shimadzu (1 mentions)
Ultrasound bath, by Bandelin (1 mentions)
Tensor 27, by Bruker (1 mentions)
Ifs 66 s, by Bruker (1 mentions)
Jfc 1600 auto fine coater, by JEOL (1 mentions)
Discovery hybrid rheometer 2, by TA Instruments (1 mentions)
Spectramax id5, by Molecular Devices (1 mentions)
Uv 1900i, by Shimadzu (1 mentions)
Nano z, by Malvern Panalytical (1 mentions)
12 protocols using jsm 7600f schottky field emission scanning electron microscope
1
Microstructural Analysis of Bilayer Film
2
Microstructure Analysis of Surface-Modified Fibers
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Scanning-electron microscopy (SEM) was used to study the microstructures of as-prepared (PCL-ref) and surface-modified thin fibers (PCL-Ag and PCL-Ag-24 h) using a JSM-7600F Schottky field-emission scanning-electron microscope (JEOL Ltd., Singapore) equipped with an energy-dispersive X-ray (EDX) detector operating at 15 kV. To compensate for the surface charge and prevent sample damage, the samples were coated with a 40 nm thick Pt layer using a Smart Coater (JEOL Ltd.). We used EDX spectroscopy (EDXS) to examine the chemical and phase compositions using an 80-mm2 X-Max EDX detector (Oxford Instruments, Abingdon, UK). We carried out X-ray photoelectron spectroscopy (XPS) investigations using a PHI VersaProbe III spectrometer (ULVAC-PHI Inc., Osaka, Japan). The apparatus was fitted with a monochromatic Al K X-ray source (hv = 1486.6 eV), and investigations were performed at 23.5 eV pass energy and 50 W X-ray power. After removing the Shirley-type noise, the spectra were fitted using the CasaXPS program. The examined region had a maximum lateral resolution of 0.7 mm. By changing the hydrocarbon CHx component to 285.0 eV, the binding-energy scale was calibrated. Binding energies (BEs) were obtained from the literature for all carbon and oxygen environments [30 (link),31 (link),32 (link)].
3
Characterization of CTAB-modified Graphene Oxide Particles
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The morphological analysis of the CTAB-modified graphene oxide particles, as well as the PLA and PLA/GO polymer matrix, was performed using a JEOL model JSM-7600F Schottky field emission scanning electron microscope (FE-SEM). It has an energy-dispersive X-ray spectroscopy (EDS) elemental analysis system that offers a resolution of 1.0 nm at 133 eV. The samples were coated with gold using a sputter coating device, ensuring detailed and accurate observations of the samples.
The analysis of the electron diffraction pattern and the measurement of the interplanar distance were performed using a JEOL ARM200F transmission electron microscope (TEM) with high angle annular dark-field (HAADF) STEM imaging and Digital Micrograph Software. These NPs in suspension were deposited dropwise on a TEM grid until their evaporation at room temperature for 6 hours.
The analysis of the electron diffraction pattern and the measurement of the interplanar distance were performed using a JEOL ARM200F transmission electron microscope (TEM) with high angle annular dark-field (HAADF) STEM imaging and Digital Micrograph Software. These NPs in suspension were deposited dropwise on a TEM grid until their evaporation at room temperature for 6 hours.
4
Scanning Electron Microscopy Analysis of Paper Samples
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Morphological properties of the samples were analyzed using scanning electron microscopy (SEM). Approximately 5 × 5 mm2 pieces of treated and untreated paper were cut from the material. They were attached onto aluminum stubs using conductive carbon tape, and their edges connected to the stub surface using carbon paste and coated with a thin gold layer (10–12 nm thick) using a Balzers SCD 050 sputter coater (BAL-TEC GmbH, Schalksmühle, Germany). The SEM images were obtained using a Jeol JSM-7600F Schottky Field Emission scanning electron microscope (Jeol Ltd., Tokyo, Japan).
5
Characterization of Nanofibrous Materials by SEM and XPS
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The microstructures of nanofibers and deposited layers was studied by scanning electron microscopy (SEM) using a JSM-7600F Schottky field emission scanning electron microscope (JEOL Ltd., Tokyo, Japan) equipped with an energy-dispersive X-ray (EDX) X-Max 80 Premium detector (Oxford Instruments, Abingdon, UK) operated at 15 kV.
The chemical composition of sample surfaces was determined by X-ray photoelectron spectroscopy (XPS) using an Axis Supra spectrometer (Kratos Analytical, Manchester, UK) equipped with a monochromatic Al Kα X-ray source. The maximum lateral resolution of analyzed area was 0.7 mm. The spectra were fitted using CasaXPS software after subtracting the Shirley-type background. The binding energies (BE) for all carbon and oxygen environments were taken from the literature [47 (link),48 (link)]. The BE scale was calibrated by setting the CHx component at 285 eV.
The chemical composition of sample surfaces was determined by X-ray photoelectron spectroscopy (XPS) using an Axis Supra spectrometer (Kratos Analytical, Manchester, UK) equipped with a monochromatic Al Kα X-ray source. The maximum lateral resolution of analyzed area was 0.7 mm. The spectra were fitted using CasaXPS software after subtracting the Shirley-type background. The binding energies (BE) for all carbon and oxygen environments were taken from the literature [47 (link),48 (link)]. The BE scale was calibrated by setting the CHx component at 285 eV.
6
Characterization of PLGA Nanoparticles by SEM
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The freeze-dried PLGA NP were resuspended in distilled water and centrifuged at 20,000 rpm (14 °C, 30 min) to remove D-mannitol and excess PVA. Then the supernatant solution was discarded, and the precipitated nanoparticles were resuspended in the same amount of distilled water using Vortex (Velp Scientifica, Deer Park, NY, USA) and ultrasound bath (Bandelin Electronic GmbH & Co. KG, Berlin, Germany). The drop of PLGA NP suspension (diluted 5-fold) was placed on a sample table, air-dried, and then sputtered with a layer of platinum for 6 to 30 s which produces a surface layer of Pt with a thickness of 13 nm. The table was then placed in the JSM-7600F Schottky field emission scanning electron microscope (JEOL, Nieuw-Vennep, Japan), and the sample was imaged in the secondary electron mode (planar). Capturing mode: high vacuum, accelerating voltage up to 15 kV, detection of secondary electrons (planar).
7
Characterizing STICH Material Composition
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The morphology of the STICH and control materials were analyzed with scanning electron microscopy (SEM; JSM-7600F Schottky-field-emission scanning electron microscope; JEOL USA, Inc., Peabody, MA, USA). To investigate the chemical compositions of the Alg, CMC, and PAAm in the STICH as well as their interactions, the STICH and the controls were analyzed with attenuated-total-reflectance Fourier transform infrared (ATR-FTIR) spectroscopy (Bruker IFS-66/S, TENSOR27, Bruker, Republic of Korea).
8
Characterizing Pollen Particles with Freeze-Drying SEM
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For the defatted samples, the pollen particles were dried in a freeze dryer (Labconco) under 0.008 mbar vacuum pressure for two days. For the microgel samples, 3 μL of the sample was dispersed in 200 μL of the appropriate medium in a 1.5 mL microcentrifuge tube and then frozen with liquid nitrogen for 2 min, followed by drying in a freeze dryer for two days. The dried samples were spread and immobilized on a sample holder with copper tape and sputter-coated with a 20-nm thick gold film using a JFC-1600 Auto Fine Coater (JEOL, Tokyo, Japan; operating settings, 20 mA for 80 s). For cross-sectional observation, the dried samples were adhered onto a piece of double-sided copper tape (2 cm × 1.3 cm) and dipped into liquid nitrogen for 5 min. Then, multiple cuts were conducted across the frozen sample with a surgical blade (B. Braun Melsungen AG, Melsungen, Germany). Finally, the pollen-adhered copper tape was dried in a freeze dryer for two days. Field-emission SEM imaging was performed using a JSM-7600F Schottky field-emission scanning electron microscope (JEOL) at an accelerating voltage of 5.00 kV under various magnification levels (between ×1500 and ×15000).
9
Alginate-Based Hydrogel for Bioelectronics
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Alg-BA 2 w/v% dissolved in DW was mixed with OEGCG 10 w/v% dissolved in DW at a volume ratio of 5:2 to create a transparent brown hydrogel (Alg-BA/OEGCG). Sodium chloride (NaCl) was added to the Alg-BA/OEGCG hydrogel to improve the conductivity of the hydrogel for bio-electro devices (Alg-BA/OEGCG/NaCl). The sequence of mixing the three components—Alg-BA, OEGCG, and NaCl—was varied to determine a proper gelation method. First, Alg-BA/OEGCG hydrogel was soaked in a solution with various NaCl concentrations (1 w/v% and 2 w/v%). Second, OEGCG and NaCl were initially mixed, and then they were mixed with Alg-BA. Finally, OEGCG was added to a solution of Alg-BA with NaCl. The rheological properties of the hydrogels were measured using a Discovery Hybrid Rheometer 2 (TA Instrument, New Castle, DE, USA) with a 20 mm-diameter parallel plate geometry and gap size of 300 μm via frequency sweep from 0.01 to 10 Hz at 2% strain and 25 °C. For the morphological characterization of the hydrogels, Alg-BA/OEGCG or Alg-BA/OEGCG/NaCl gels were freeze-dried. The morphology of each hydrogel was analyzed by scanning electron microscopy (SEM) (JSM-7600F Schottky field emission scanning electron microscope, JEOL USA, Inc., Peabody, MA, USA).
10
Bulk Refractive Index Sensitivity Characterization of Gold Nanorods
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SEM images were obtained using a JSM-7600F Schottky field-emission scanning electron microscope (JEOL, Tokyo, Japan). The number density of deposited AuNRs in the SEM images was analyzed by ImageJ software (National Institutes of Health, Bethesda, MD, USA). Optical extinction spectra were recorded using a microplate reader (SpectraMax iD5, Molecular Devices, San Jose, CA, USA). Bulk refractive index sensitivity values were measured by incubating the AuNR-coated substrates in water–glycerol mixtures with increasing glycerol fractions (0–40% v/v). To measure the bulk RI sensitivity, the maximum intensity wavelength (Δλmax) was obtained as a function of the change in refractive index units (ΔRIU) for different water–glycerol mixtures and the slope (Δλmax/ΔRIU) was calculated by linear regression analysis [51 (link)].
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