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Prestige 21 infrared spectrophotometer

Manufactured by Shimadzu
Sourced in Japan

The Prestige-21 is an infrared spectrophotometer manufactured by Shimadzu. It is designed to analyze the chemical composition of samples by detecting the absorption or transmission of infrared radiation. The instrument measures the intensity of light as a function of wavelength, which can be used to identify the presence of specific functional groups or compounds within a sample.

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2 protocols using prestige 21 infrared spectrophotometer

1

Characterization of Organic Cocrystals

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PXRD was performed on a power X-ray diffractometer (D2 Phaser, Bruker Co., Bremen, Germany) using a Cu-Kα source at 30 kV and 10 mA. The PXRD pattern was collected from 5° to 40° (2θ) at ambient temperature with a step size of 0.05°(2θ) and time per step of 0.3 s. DSC analysis was performed on a DSC 214 apparatus (NETZSCH Company, Selb, Germany). Approximately 3–5 mg of sample was accurately weighed and placed in an aluminum pan. The sample pan was heated from 20 to 400 °C at a rate of 5 °C∙min−1 under a nitrogen purge of 50 mL∙min−1. The empty aluminum pan was used as a reference. The SEM system (Hitachi S-4800, Tokyo, Japan) was used to observe the morphologies of GA, CCFs and the cocrystals. By dropping the ethanol suspension of the sample onto the electric glass slice, the precipitate on the glass slice was observed after the solvent volatilized. The FTIR spectra were recorded on a Prestige-21 infrared spectrophotometer (Shimadzu, Japan) using the KBr pellet method. The scan range was set from 400 to 4000 cm−1 at 2 cm−1 resolution. The 1H NMR spectra were recorded on a WIPM 400 MHz NMR spectrometer (Zhongke-Niujin, Wuhan, China) at a temperature of 293.1 K. Samples were prepared by dissolving about 5 mg of sample in 500 μL of D2O. The spectral width was set as 11,013 Hz. The cumulative number of times was 16, and the relaxation time D1 was 1 s.
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2

Characterization of Nanomaterial Properties

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The crystalline phase structure and size of the products were determined from X-ray powder diffraction (XRPD) using Panalytical X'pert-Pro diffractometer system in the 2θ range from 10° to 80° with Cu Kα radiation (λ = 1.5418 Å). The morphology of the as prepared samples was observed using scanning electron microscope (Quanta 200 3D) equipped with EDS measurement. The UV-Visible absorption spectra of the samples were recorded on T90+ UV/Vis Spectrophotometer (PG instruments Ltd). The FT-IR spectra of the prepared samples were recorded by using Shimadzu Prestige-21 infra-red spectrophotometer. The particle size of the samples was determined by the dynamic light scattering (DLS) technique using a Zetasizer nano ZS 90, Malvern make. All the measurements were performed at room temperature.
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