Transmission electron microscopy (TEM) images were obtained with a JEM2100F high-resolution transmission electron microscope (JEOL, Tokyo, Japan) at an acceleration voltage of 200 kV. All measurements of fluorescence were performed under a 360 nm excitation wavelength. All samples were decanted in a standard 1 cm pathway spectrophotometric cuvette. The fluorescence signal corresponded the maximum emission of GQDs well at 466 nm. Records were obtained on a Shimadzu RF-5301 spectrometer (Shimadzu, Kyoto, Japan). Optical measurements were done in aqueous solutions at room temperature.
Jem2100f high
Manufactured by JEOL
Sourced in Japan
The JEM2100F is a high-resolution transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality imaging and analysis capabilities for a wide range of materials and applications. The JEM2100F features a field emission gun (FEG) electron source, which enables high-resolution imaging and analysis at accelerating voltages up to 200 kV. The microscope is equipped with advanced optics and detectors to support a variety of imaging and analytical techniques.
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Lab products found in correlation
2 protocols using jem2100f high
1
Characterizing Graphene Quantum Dots
2
Characterization of Confined and Free C-dots
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The nanostructure of “confined” (extracted from the hybrids) and “free” (prepared in solution) C-dots was studied by a JEOL JEM-2100F high-resolution transmission electron microscope (HRTEM), at an accelerating voltage of 200 keV. Confined C-dots were collected from PSiO2/C-dots hybrids after dissolution of the PSiO2 matrix in a solution of HF and ethanol (3:1 v/v, respectively), followed by extraction of C-dots in absolute ethanol. Subsequently, the resulting C-dots solution was drop-casted on a graphene-coated copper grid.
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