Ft ir 680plus instrument

Unless otherwise state, materials were obtained from commercial suppliers and purified by distillation. ¹H NMR spectra were recorded on a JEOL JNM-ECS400 (400 MHz) spectrometer or JEOL JNM-ECX400 (400 MHz) FT spectrometer in CDCl₃ as the solvent with tetramethylsilane (TMS) as an internal standard. ¹³C NMR spectra were taken mainly on JEOL JNM-ECS400 (100 MHz) and JEOL JNM-ECX400 (100 MHz) FT spectrometers in CDCl_3.³¹P NMR spectra were recorded on a JEOL JNM-ECX400 (162 MHz) FT spectrometer in CDCl₃ with 85% H₃PO₄ solution as an external standard or a Bruker BioSpin Ascend 400 spectrometer (162 MHz). ¹⁹F NMR spectra were recorded on a Bruker BioSpin Ascend 400 spectrometer (377 MHz). IR spectra were recorded on JASCO FT/IR-680Plus instrument. High-resolution mass spectra (HRMS) were recorded on a Bruker micrOTOF II ESI(+)/TOF instrument.

Thermal properties were examined by thermogravimetric analysis (TGA, Q50, TA Instruments, Inc.) at a heating rate of 10 °C/min under N₂ atmosphere. Thermomechanical properties were measured by thermomechanical analysis (TMA, EXTAR TMA/SS 6100, Seiko Instrument, Inc.) at a heating rate of 10 °C/min. Fourier-transform infrared (FT-IR) spectra were recorded with on an FT-IR 680 plus instrument (JASCO, U.S.A.). ²⁹Si nuclear magnetic resonance (NMR) spectra were obtained using a DMX600 FT 600-MHz spectrometer (Bruker Biospin, Australia). Mechanical properties were measured using a universal testing machine (AGS-X STD, Shimadzu, Japan). The dielectric properties of the composites (at 5 Hz) were measured using a microdielectrometer (AET, Japan). The surface resistivity of the composites was obtained using an electrometer (6517 B, Keithley, USA) and a resistivity test fixture (8009, Keithley, USA). The breakdown strengths of the composites were recorded using a breakdown strength tester (SKY-HAV-1010, SKY Innotek, Republic of Korea). The thermal conductivity was determined using a thermal conductivity analyzer (LAF 6720, C-Therm Technologies, Canada). The SEM images were obtained using scanning electron microscopy (S-4800, Hitachi, Japan)