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200 cx microscope

Manufactured by JEOL
Sourced in Japan, United States

The JEOL 200 CX is a transmission electron microscope capable of high-resolution imaging and analysis. It features a thermionic electron gun and can operate at an accelerating voltage of 200 kV. The instrument is designed for advanced materials characterization applications.

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5 protocols using 200 cx microscope

1

Characterization of Gadolinium-Doped Nanoparticles

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TEM imaging was performed on a JEOL 200CX microscope at an accelerating voltage of 200 kV. Powder XRD patterns were measured on a Japanese Rigaku D/MAX-2250V diffractometer. Fourier transform infrared spectroscopy (FT-IR) was performed on a Nicolet Avatar 370 FT-IR spectrophotometer using KBr disks. The Gd concentration of the NPBCN solution was measured by inductively coupled plasma optical emission spectrometry (ICP-OES) after dissolving in aqua regia. The T1 imaging ability of NPBCNs was determined as T1 relaxivity (r1) using a 3.0 T MR scanner (Discovery MR 750, GE Medical Systems, Milwaukee, WI, USA) with an 8-channel head coil. The MR scanning parameters were as follows: gradient TI (50, 100, 150, 200, 300, 400, 800, 1500, and 2000 ms); TE/TR = 7.9 ms/5000 ms; echo train length (ETL) = 8, NEX = 3, bandwidth = ±125 kHz.
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2

Characterization of Microgel-Encapsulated Drug Release

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Monomer conversions after polymerization were analyzed by 1H NMR spectroscopy on a QUANTUM-I-400MHz spectrometer using D2O as the solvent. The hydrodynamic diameter and polydispersity indexes of the microgels were analyzed using dynamic light scattering (DLS) measurements using a Malvern ZS90 with a He–Ne laser (633 nm, 4 mW) at a 90° angle. The morphology of the microgel was observed by using a transmission electron microscope (TEM) on a Jeol 200CX microscope (200 kV). To prepare the TEM samples, a small drop of the microgel solution (1 mg/ml) was carefully deposited onto a carbon-coated copper electron microscopy grid and vacuum-dried overnight. The in vitro release of FS from the microgels and the residual FS in rabbit tear samples were analyzed using fluorescence spectroscopy. Human corneal epithelial cells (HCECs) were observed on an inverted fluorescence microscope (Zeiss Axio Vert a3, Germany).
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3

Low-Resolution TEM Imaging Protocol

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Low resolution transmission electron microscopy (TEM) was performed on a JEOL 200 CX microscope. TEM grids were purchased from Ted Pella, Inc. and consisted of 3–4 nm amorphous carbon film supported on a 400-mesh copper grid.
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4

Synthesis and Characterization of Au NPs

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All chemicals and solvents were purchased from Aldrich (Bucharest, Romania) or Chimopar (Bucharest, Romania). 1H- and 13C-NMR spectra were recorded on a Bruker 300 MHz instrument (Rheinstetten, Germany), using deuterated chloroform as the solvent and tetramethylsilane (TMS) as the internal standard. Infrared (IR) spectra were recorded on a Bruker FT-IR apparatus (Bremen, Germany). UV-Vis spectra were recorded in water at room temperature using an UVD-3500 double beam spectrophotometer (Labomed, LA, USA). Dinamic light scattering (DLS) analysis was performed in water on a Beckman Coulter particle size analyzer (Brea, CA, USA) using the Delsa Nano software (Beckman Coulter, Brea, CA, USA). Transmission electron microscopy (TEM) pictures were obtained using a Jeol 200 CX microscope (Jeol, Tokyo, Japan); a drop of diluted Au NPs was added on a 3 mm carbon copper grid and left to dry.
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5

Nanoparticle Characterization by TEM

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Samples were prepared for transmission electron microscopy (TEM) by depositing a drop of the nanoparticles in solution at 1 mg/ml on a formvar-coated copper grid. A JEOL 200CX microscope operated at 120 kV (Peabody, MA, USA) was used to obtain images. The number-weighted mean diameter and the geometric deviation were obtained by fitting the data to a lognormal size distribution.
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