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38 protocols using tecnai g2 s twin

1

Structural Analysis of Crystalline Samples

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The crystalline structures of the samples were investigated by X-ray diffraction (Rigaku-D/MAX-2550PC, Cu Ka radiation, λ = 1.54056 Å). The morphology of the obtained samples was assessed on a field emission scanning electron microscope (FESEM, FEI Quanta 200F) and with transmission electron microscopy (TEM, FEI Tecnai G2 S-Twin) with an operating voltage of 300 kV. Scanning transmission electron microscopy X-ray energy dispersive spectrometry (STEM-XEDS) was also performed on an FEI Tecnai G2 S-Twin transmission electron microscope, equipped for energy dispersive X-ray spectroscopy in the STEM mode. The elemental composition was investigated with a 1 nm probe size and 20 cm camera length.
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2

Multimodal Characterization of UCNPs@mSiO2-Ce6

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X-ray diffraction (XRD) was conducted with a Rigaku D/max-TTR-III diffractometer utilizing Cu-Ka radiation (λ = 0.15405 nm). Transmission electron microscopy images were captured on an FEI Tecnai G2S-Twin with a field emission gun operating at 200 kV. A Hitachi U-3100 spectrophotometer was used to characterize the UV-visible spectra of the samples. The solution of the UCNPs@mSiO2-Ce6 (1 mg/mL) was oscillated in the constant temperature water bath oscillator, and the ultraviolet absorption spectra at 650 nm was measured before and after centrifugation (2000 rpm, 5 mins) once a day to evaluate the stability of Ce6. Fourier transform infrared (FT-IR) spectroscopy spectra were got on a Perkin-Elmer 580BIR spectrophotometer utilizing the KBr pellet as the background. The fluorescence life curves of the samples were recorded and measured using the Tektronix MSO/DPO4000 oscilloscope. Upconversion emission spectra were tested on a R955 Hamamatsu photomultiplier tube, from 400 to 800 nm, the 808 nm laser diode module (K98D08M-30W, China) was used as the irradiation source. The images of confocal microscopy were recorded by a Leica TCS SP8. All the measurements were performed at room temperature.
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3

Characterization of NiCo2S4@NiO Nanostructures

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The morphologies of the samples were characterized by scanning electron microscopy (SEM, FEI Nova NanoSEM 450) and transmission electron microscopy (TEM, FEI Tecnai G2 S-TWIN). The crystallographic phases of the NiCo2S4@NiO NWAs were characterized by X-ray diffraction (XRD) with radiation from a Cu target (Kα, λ = 0.154 nm).
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4

Characterization of Photothermal Nanofilms

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UV-vis absorption spectrum is obtained using a Perkin Lambda UV-vis-NIR spectrophotometer. The transparency and reflectance are recorded using a UV-via NIR spectrometer with an integrating sphere unit. X-ray diffraction (XRD) is recorded using a Shimadzu XRD-7000 with Cu-Kradiation. The morphology and characterizations of the obtained samples is assessed on a field emission scanning electron microscope (FESEM, FEI Quanta 200 F) and with transmission electron microscopy (TEM, FEI Tecnai G2 S-Twin) with an operating voltage of 300 kV. Electrical conductivity is measured by multimeter. Optical microscope image is recorded on Leica DM500. All optical measurements are performed at room temperature.
The external adjustable power 808 nm NIR laser with a spot size of 0.6 cm2 is used to measure the photothermal conversion performance of nanofilm. The output power is independently calibrated using a handy optical power meter. The in-situ temperature is recorded by an infrared thermometer with accuracy of ±0.1 °C tilted 45°relative to the path of the laser.
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5

Characterization of Functional Materials

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The X-ray diffraction (XRD) measurements were performed on a D8 Focus diffractometer (Bruker) with Cu Kα radiation (λ = 0.15405 nm). Transmission electron microscopy (TEM) was performed using FEI Tecnai G2 S-Twin with a field emission gun operating at 200 kV. Thermogravimetric and differential scanning calorimetry (TG-DSC) data were recorded with a Netzsch Thermoanalyzer STA 409 with a heating rate of 10 °C min−1 in N2 environment. UV-vis absorption spectra were measured by Beijing Pushi General Instrument Tu-1901. The PL measurements were performed with a Hitachi F-7000 spectrophotometer equipped with a 150 W xenon lamp as the excitation source. The mechanical properties of the film are tested by Universal testing machine (UTM4104). The luminescence decay curves were obtained from a Lecroy Wave Runner 6100 digital oscilloscope (1 GHz) using a tunable laser (pulse width = 4 ns, gate = 50 ns) as the excitation source (Continuum Sunlite OPO). The thickness of gelatin films was measured by a step profiler (AMBIOS, XP-100). The Fourier transform infrared (FTIR) spectra were recorded on a Nicolet 6700 spectrophotometer (USA) in the range of 4000–400 cm−1.
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6

Multimodal Structural Characterization

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A Hitachi S-4800 field emission scanning electron microscope (SEM) was used to characterize the morphologies of samples. The Raman spectra were collected with a customized LabRAM HR800 confocal Raman microscope (HORIBA Jobin Yvon). Transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM) images acquired on a FEI Tecnai G2 S-Twin were used to determine size, interlayer spacing, and sample morphology. Surface elemental analysis was performed by X-ray photoelectron spectroscopy (XPS) using an ESCALABMKLL X-ray photoelectron spectrometer.
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7

Synthesis and Characterization of PEG-Capped CZNPs

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PEG capped CZNPs were synthesized using a non-hydrolytic sol–gel reaction method as described previously [32 (link)]. We also used the PEGylation method to make water-dispensable CZNPs [31 (link), 33 (link)]. The synthesis process of PEG-CZNPs is briefly described in Additional file 1: Supplementary method and schematically shown in Additional file 1: Fig.S1A. The PEG-CZNPs were then characterized using field-emission transmission electron microscopy (FE-TEM), selected area electron diffraction (SAED), energy dispersive X-ray spectroscopy (EDS) (Tecnai G2 S-TWIN; FEI Company, Eindhoven), bio-high voltage electron microscope (Bio-HVEM, JEM-1400 Plus and JEM-1000 BEF; JEOL Ltd.,Tokyo), multi-purpose X ray-diffractometer (XRD, X’Pert Powder; Malvern Panalytical, Malvern), thermogravimetric analysis (TGA, SCINCO TGA 1000; Scinco Co., Seoul), dynamic light scattering measurements (DLS, Zetasizer Nano-ZS system; Malvern Instruments Ltd., Malvern). 1,1-diphenyl-2-picrylhydrazyl (DPPH) free radical scavenging assays were performed to examine the antioxidant capacity of PEG-CZNPs as described previously [32 (link)]. To confirm the intracellular localization of PEG-CZNPs we have made FITC conjugated PEG-CZNPs. The process of the preparation of FITC conjugated PEG-CZNPs is briefly shown in in Additional file 1: Supplementary method and Fig. S1B,C.
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8

Characterizing Crystallites with TEM

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Transmission Electron Microscope (TEM) was used to characterize the morphology of CNCs. Measurement was conducted on a FEI Tecnai G2S-Twin (FEI, USA) with a field emission gun working at 200 kV. More than 100 individual crystallites in the TEM images were measured to gain the size distribution using ImageJ.
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9

Comprehensive Structural Characterization of Materials

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Crystalline structure, the morphology, and chemical composition of the samples were investigated by powder X-ray diffraction (XRD) (Rigaku D/max TTR-III diffractometer with graphite monochromatized Cu Kα radiation (λ = 0.15405 nm)), scanning electron microscope (SEM, JSM-6480A), transmission electron microscopy (TEM, FEI Tecnai G2 S-Twin), high-resolution transmission electron microscopy (HRTEM), and the X-ray photoelectron spectra XPS (VG ESCALAB MK II electron energy spectrometer using Mg KR (1253.6 eV) as the X-ray excitation source). Raman spectra were conducted on a confocal laser microRaman spectrometer (LABRAM-HR, JY Co.), and N2 adsorption/desorption isotherms were measured from Micromeritics ASAP Tristar II 3020 apparatus. The electrochemical properties were carried out by a CHI 666D electrochemical workstation. All the tests were carried out at room temperature.
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10

Characterization of Gadolinium Phosphate Nanostructures

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The crystal phase was analyzed by powder X-ray diffraction (XRD; Bruker Co., Bremen, Germany) on a D8 Advance diffractometer using Cu Kα radiation (λ = 0.154 Å). The morphology, structure and size of the samples were determined by field-emission scanning electron microscopy (FESEM; Philips XL30 ESEM FEG, Japan) and transmission electron microscopy (TEM; FEI Tecnai G2 S-Twin, München, Germany). The elemental compositions were analyzed by energy-dispersive X-ray energy spectrometry (EDX; Philips, XL-30 W/TMP, Konan, Japan). Fourier transform infrared spectrometry (FT-IR, Bio-Rad Win-IR Spectrometer, Watford, UK) was recorded in the range of 400–4000 cm−1 using the attenuated total reflection (ATR) mode and the KBr slice method. Atom force microscopy (AFM) images were acquired by Bruker’s Dimension Icon and Multimode-V AFM. The amounts of GdPO4·H2O, GdPO4·H2O@SiO2, GdPO4·H2O@SiO2–APS, and PBLG-g-GdPO4·H2O were determined by thermogravimetric analysis (TGA, TA Instruments TGA500, New Castle, DE, USA) in air at a heating rate of 10 °C/min from 25 °C to 800 °C.
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