Tecnai g2 s twin
The Tecnai G2 S-Twin is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a twin-lens system that provides stable and reliable performance for a variety of applications.
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38 protocols using tecnai g2 s twin
Structural Analysis of Crystalline Samples
Multimodal Characterization of UCNPs@mSiO2-Ce6
Characterization of NiCo2S4@NiO Nanostructures
Characterization of Photothermal Nanofilms
The external adjustable power 808 nm NIR laser with a spot size of 0.6 cm2 is used to measure the photothermal conversion performance of nanofilm. The output power is independently calibrated using a handy optical power meter. The in-situ temperature is recorded by an infrared thermometer with accuracy of ±0.1 °C tilted 45°relative to the path of the laser.
Characterization of Functional Materials
Multimodal Structural Characterization
Synthesis and Characterization of PEG-Capped CZNPs
Characterizing Crystallites with TEM
Comprehensive Structural Characterization of Materials
Characterization of Gadolinium Phosphate Nanostructures
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