Sigma vp40 field emission scanning electron microscope
The Sigma VP40 is a field emission scanning electron microscope (FE-SEM) manufactured by Zeiss. It is designed for high-resolution imaging and analysis of a wide range of materials. The Sigma VP40 utilizes a field emission electron source to generate a focused beam of electrons, which is then scanned across the sample surface to produce detailed images. The microscope offers a high resolution of up to 0.8 nm and can operate in both high and low vacuum conditions, allowing for the analysis of a variety of sample types.
5 protocols using sigma vp40 field emission scanning electron microscope
SEM Imaging of Biofilm Formation
Scanning Electron Microscopy of Burn Eschar
Scanning Electron Microscopy of Burn Wound Biofilms
To determine P. aeruginosa tissue penetration, paraffin-embedded histologic sections on microscopy slides were deparaffinized with 100% xylene and allowed to air dry before being coated with carbon and gold/palladium. All samples were observed with a Sigma VP40 field emission scanning electron microscope (Carl Zeiss, Inc., Germany) in high vacuum mode at 2 kV.
MSSA Bacteria Sample Preparation for SEM
Scanning Electron Microscopy of Biofilms
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