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Fluorolog system

Manufactured by Horiba

The Fluorolog system is a high-performance fluorescence spectrometer designed for scientific research and analysis. It provides accurate and reliable measurements of fluorescence properties of samples. The core function of the Fluorolog system is to measure the emission and excitation spectra of fluorescent materials, enabling researchers to characterize and study the photophysical properties of their samples.

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5 protocols using fluorolog system

1

Fluorescence Quantum Yield Measurement

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The QY was calculated using a standard method43 (link), which was performed using a Quanta-Phi integrating sphere coupled to a Horiba Fluorolog system. A monochromated Xe lamp was used as an excitation source. Parameters used in the measurement are as follows: excitation wavelength = 440 nm; bandpass values of 2 and 2 nm for the excitation and emission slits; step increments = 1 nm; integration time = 0.1 s per data point. Excitation and emission spectra were collected with the sample directly in the excitation beam path and with a sample offset from the beam path and the empty sphere. A neutral density filter with a known transmission was used to measure the excitation intensity.
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2

CsPbBr3 QW Optical Characterization

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Absorption spectra for CsPbBr3 QWs were collected using a fiber coupled modular spectrometer (USB 2000+, ocean optics). PL spectra of CsPbBr3 QWs thin films were collected using a Horiba Fluorolog system with a xenon lamp as the excitation source. The sample was placed at an incidence angle of 30°. The PL spectra were collected using a calibrated monochromator:single-photon-detector assembly. The PL lifetime data was recorded on using a time-correlated single-photon counting (TCSPC) system (Horiba). PLQY is measured using an integrating sphere.
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3

Comprehensive Characterization of Perovskite-PbS Quantum Dot Hybrid Films

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The morphology of the films was analyzed by scanning electron microscopy (SEM) using a JSM7001F (field emission scanning electron microscope). The absorbance spectrum of the as-synthesized PbS QDs (with the oleate ligand, PbS_OA) was measured using a Cary 500 Scan Varian UV-VIS-NIR spectrophotometer. The photoluminescence (PL) measurement of PbS_OA, PbS_MAPI, and PbS_CsPI QDs in solution was carried out using a CCD detector (InGaAs Andor-iDUS DU490A-2.2) coupled with an adaptive focus imaging spectrograph (Kymera KY-193i-B2). A commercial continuous laser (532 nm, GL532RM-150) was used as an excitation source. The PL spectra of PbS_ABA QDs in solution were measured using a Fluorolog system (Horiba Jobin Yvon) with a 532 nm excitation wavelength. PL spectra of MAPI and MAPI-PbS films were also measured using the same Fluorolog system and excitation. For the PL measurement, a long-pass filter, 20CGA-590, was used in order to block the excitation source. A Bruker AXS-D4 Endeavor Advance X-ray diffractometer with Cu Kα radiation was used to measure the X-ray diffraction (XRD) spectra of MAPI and hybrid HP–PbS films. Fourier-transform infrared absorption (FT-IR) was measured using an FT-IR 6200 spectrometer (Jasco) with an ATR Pro One (Jasco) equipped with a diamond crystal.
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4

Comprehensive Optical Characterization of Optoelectronic Materials

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The UV–vis absorption spectrum was measured by Thermo Evolution 300 UV–visible‐spectrometer. FT‐IR spectra were measured using Nicolet380 spectrometer. DSC was performed with a TA Q20 instrument at a heating rate of 10 °C min−1. The steady‐state PL spectrum and TRPL were tested by Edinburgh Instruments, with the excitation wavelength of 360 nm, and the nano‐LED light source was 367 nm. The absolute PLQY TRPL spectra were acquired from a Horiba Fluorolog system. X‐ray diffraction for phase analysis of the synthesized materials was conducted by Rigaku Miniflex 600. The surface morphology of HTL and QDs films was characterized by atomic force microscopy (AFM) and Transmission electron microscope (TEM JEM‐2100F). HOMO Energy level could be determined by Thermo ESCALAB 250Xi Ultraviolet Photoelectron Spectroscopy (UPS). A monochromatic He I light source (21.2 eV)) and VG Scienta R4000 analyzer were used to measure the valence band energy spectrum. The secondary electron cut‐off edge was observed by applying a −5 V bias to the sample. The optical properties were characterized by a polarizing microscopy on a SOPTOP‐CX40P instrument. JVL characteristics, EL spectrum, EQE, and CIE chromaticity coordinates were tested by Keithley 2400 Source meter and Chroma Meter CS‐2000 under nitrogen environment.
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5

Steady-State Photoluminescence Spectroscopy

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Steady-state
photoluminescence spectra (PL) were recorded using a Horiba Fluorolog
system with an integrating sphere and a monochromatic Xe lamp as the
excitation source.
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