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Dii 29030sctr

Manufactured by JEOL
Sourced in Japan, United States

The DII-29030SCTR is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It features a high-resolution imaging system, advanced electron optics, and a versatile sample handling system. The core function of the DII-29030SCTR is to provide detailed, high-quality images and analytical data for a wide range of materials and applications.

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3 protocols using dii 29030sctr

1

Microstructural Analysis of Composites

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In order to assess the microstructure of the composites after the tensile test, microphotography was performed using a scanning electron microscope SEM (JEOL JSM-IT200, Tokyo, Japan) in low-vacuum at 20 kV at 50 ×, 500 × and 1000 × magnification. Before placing the composites in the electron microscope chamber, they were covered with gold particles using a sputter coater (DII-29030SCTR, JEOL, Tokyo, Japan).
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2

Morphological Analysis of Gum Samples

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The FE-SEM (JSM-7610F Plus, JEOL, Japan) was used to detect the morphological characteristics of powdered gum samples of CMTKP and C-CMTKP. The sample was placed on a sample stub employing double-sided carbon adhesive tape. The gold coating was done for 40 seconds in the coating chamber (D II-29030SCTR, Smart coater, JEOL, USA) using the argon gas. Then micrographic images were captured at specific magnifications. EDX (EDAX, AMETEK -Materials Analysis Division, US) analysis was used to map the elements present in a powdered gum sample of CMTKP and C-CMTKP.
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3

Scanning Electron Microscopy of Fruit Micromorphology

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Matured, entire fruit and fruit peelings were selected for SEM study and then they were put in a desiccator for 1-2 days for drying, then gold coated with a sputter coater (model: JEOL DII-29030SCTR) for about 2 min in fully dried conditions. After that, fruit micromorphological observation was conducted through Scanning Electron Microscope (model: JSM-IT100) with about 2-8 kV energy. Matured seed testa was studied in same manner.
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