S 5200
The S-5200 is a high-resolution scanning electron microscope (SEM) produced by Hitachi. It is designed to provide detailed imaging and analysis of samples at the nanoscale level. The S-5200 offers high-resolution imaging capabilities and a variety of analytical tools to support research and development activities across various industries.
Lab products found in correlation
43 protocols using s 5200
Scanning Electron Microscopy and Elemental Mapping
Surface Characterization of Nanostructured Platforms
Structural Characterization of Sharklet AFTM
Comprehensive Material Characterization Protocol
Thermogravimetric (TG) analyses were conducted using Thermo Plus Evo2 (Rigaku, Tokyo, Japan). Measurements were carried out in the air from room temperature to 400 °C via raising the temperature by 4 °C/min.
SEM observations were performed using S-5200 (Hitachi High-Tech, Tokyo, Japan), with the accelerating voltage of 30 kV. Studies with X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) were also conducted using Kratos Axis Ultra (Shimadzu, Kyoto, Japan) and RINT-UltimaIII/PSA (Rigaku), respectively.
Analyzing Surface Morphology of M. nitidum
extraction on solid matrixes, the
surface morphology of M. nitidum was
analyzed using SEM and FTIR. Morphology of the residue was observed
using SEM (S5200, Hitachi High-Tech Corporation, Tokyo, Japan). The
accelerating voltage was 0.5 to 30 kV, the resolution was 0.5 nm (30
kV), and the maximum magnification was ×2 000 000.
Surface functional groups were analyzed by FTIR (PerkinElmer Spectrum
Two, PerkinElmer Japan Co., Ltd., Yokohama, Japan).
Characterization of TiO2, CuxO, and TiO2-CuxO Nanofilms
The crystallinity was confirmed using X-ray diffraction (XRD; MiniFlex 600, Rigaku, Tokyo, Japan) over the 2θ range of 20–60°, with Cu Kα (λ = 0.154 nm) radiation, an accelerating voltage of 40 kV, and a current of 15 mA. The chemical states were determined using X-ray photoelectron spectroscopy (XPS; ESCA-3400, Shimadzu Corp., Kyoto, Japan). Additionally, the reflectance was measured by UV–vis diffuse reflectance spectroscopy (UV-Vis DRS, V-650, Jasco, Tokyo, Japan). Zeta potential measurements (ZEN3690, Malvern Instruments Ltd., Malvern, UK) were also conducted.
Quantitative Analysis of Aortic Endothelium
Characterization of Colored TiO2 Hybrids
Characterization of Composite Materials
Surface Morphology Analysis via FESEM
a copper platform with a conductive double-sided adhesive tape, and
a Japan Hitachi s-5200 field emission scanning electron microscope
was adopted to observe the surface morphology of the samples, the
working voltage is 0.5–30 kV, the current was 1–2 mA,
and the thickness of gold spraying was 10 nm.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!