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Miniflex powder diffractometer

Manufactured by Rigaku

The Miniflex powder diffractometer is a compact X-ray diffraction (XRD) instrument designed for phase identification and quantitative analysis of polycrystalline materials. It utilizes a high-power X-ray tube to generate a collimated X-ray beam that interacts with the sample, producing a diffraction pattern. The diffracted X-rays are then detected and analyzed to provide information about the crystal structure, composition, and relative abundance of the various phases present in the sample.

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2 protocols using miniflex powder diffractometer

1

Characterization of PW-SBA-15-SO3H Materials

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A Micromeritics ASAP 2010 instrument was used to obtain the N2 isotherms at 77 K.
The amount of PW on SBA-15 was evaluated by ICP.
The ATR-FTIR spectra were obtained using a Perkin Elmer Spectrum 100 FTIR spectrophotometer.
XRD patterns of PW, SBA-15, and PW-SBA-15-SO3H materials were obtained using a Rigaku Miniflex powder diffractometer.
TEM photos were executed on a Hitachi S-2400 instrument.
Acid-base titration was used to obtain the total acid density (mmol H+.g−1) of the materials. The acid-base titrations were carried out according to previous work [29 (link)].
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2

Comprehensive Material Characterization Protocol

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The phase purity of the as-prepared materials were characterized by XRD, Rigaku Miniflex powder diffractometer) with Cu Kα as radiation source (λ = 1.54 Å, 30 kV, 50 mA). The functional groups associated with the bending and stretching mode of vibration of the materials were specified by JASCO FT-IR-4600, using KBr reference. The exterior surface morphology and structural features of the materials were obtained by FESEM by using ZEISS Sigma 500 VP microscope. The internal structure and morphology of the material was explored under the TEM and HR-TEM analysis by using JEOL 2100. The XPS measurement was taken at an X-ray photoelectron spectrometer (ESCALAB 250XI) with X-ray source as nonmonochromatized Mg Kα and energy of 0.8 eV. The optical absorption measurements were recorded by JASCO-V-750 UV–Vis spectrophotometer. The PL emission spectra were recorded by applying excitation energy of 320 nm using JASCO-FP-8300 spectrophotometer. The surface area of the MgCr-LDH based samples were measured by N2 adsorption–desorption Brunauere–Emmett–Teller (BET) measurements using NOVA Quantachrome TouchWin v1 0.22. The pore size distribution and pore volume were obtained by applying the BJH model. PEC measurements of samples were carried out by potentiostat–galvanostat (IviumStat) terminal.
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