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Jpk nanowizard 4a

Manufactured by Bruker
Sourced in United States

The JPK Nanowizard 4a is a high-resolution atomic force microscope (AFM) designed for nanoscale imaging and analysis. It provides sub-nanometer resolution and operates in a variety of imaging modes to enable the study of surface topography, mechanical properties, and other nanoscale phenomena.

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2 protocols using jpk nanowizard 4a

1

Measuring Cell Elasticity Using AFM

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To determine the elastic modulus of cells after passing through the device, mechanical measurements of single cells were performed using AFM (JPK Nanowizard 4a) with tipless cantilevers (NPO-10, Bruker), a highly sensitive cantilever with nominal spring constants k = 0.06 N m−1 and a sample Poisson’s ratio of 0.499, found at the UCLA Nano & Pico Characterization facility. During the measurement, cells were cultured on a glass-bottom dish with prewarmed PBS and set on a temperature-controlled stage at 37 °C. The measurement was performed by indenting the plasma membrane of the cells above the nucleus. The force–distance curves were recorded and the elastic modulus of cells was calculated by NanoScope Analysis using the Hertz model.
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2

Elastic Modulus of Cells via AFM

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To determine the elastic modulus of cells after passing through the device, mechanical measurements of single cells were performed by using atomic force microscopy (AFM) (JPK Nanowizard 4a) with tipless cantilevers (NPO-10, Bruker Corp., USA), a high sensitive cantilever k=0.06 N/m, and sample Poisson's ratio of 0.499 at the UCLA Nano and Pico Characterization facility. During the measurement, cells were cultured on a glass-bottom dish with pre-warmed PBS and set on a temperature-controlled stage at 37 ℃. The force-distance curves were recorded and the elastic modulus of cells was calculated by NanoScope Analysis using the Hertz model.
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