Quanta 600 scanning electron microscope

Raman analysis was performed on the hydrazine precursor solutions including Sb-S, Sb-Se, Sb-S-Se and S-Se solutions in a backscattering confocal configuration at room temperature. A LabRAM in Via Raman system was applied for measurement, and the unpolarized light was generated through a 532 nm Ar laser with power adjusted to 50 mW. Prior to measurement, each solution was sealed in a glass vial by parafilm in order to minimize oxygen and moisture exposure. X-ray diffraction (XRD) characterization (Philips, X pert pro MRD, with Cu Kα radiation, λ = 1.54178 Å) was performed on the annealed Sb₂(S_1-xSe_x)₃ thin films prepared on TiO₂ substrates. The compositions of the thin films were obtained through energy dispersive spectroscopy (FEI Quanta 600 scanning electron microscope, 20 kV). Sb₂S₃ powder (99.999%, Alfa Aesar) and Sb₂Se₃ powder (99.999%, Alfa Aesar) were used as standards for the calibration of EDS measurements. Scanning electron microscopy (FEI Nova NanoSEM450, without Pt coating) and UV-vis-NIR transmission spectroscopy (Perkin Elmer Instruments, Lambda 950 using integrating sphere) was performed on the Sb₂(S_1-xSe_x)₃ films to determine the surface morphology and band gap, respectively.

Wear traces on archaeological and experimental tools were recorded following a multi-analytical and multi-scalar approach^{87 (link)}, which relies on the combination of optical, 3D digital, and scanning electron microscopy (Table S6). Archaeological tools were examined at the lithic laboratory of IPHES first using a 3D digital microscope Hirox KH-8700 for low-power observations (magnifications ranging from 35 × to 140 ×). Lateral lighting was used to record all the macro-scars visible on the edges to describe their initiation, termination, morphology, orientation, and distribution^{95 ,96 (link)}. High-power observations were conducted with a metallurgical microscope Zeiss Axio Scope A1 using incident lighting (magnifications 50 ×–500 ×), which enabled the observation of polish, edge rounding, striations, and micro-scarring. Use polish, edge rounding, and striations were described according to the principles outlined in several publications^{92 ,97 ,98} , and hafting traces were interpreted following guidelines stated by Rots^{33 ,84} . Finally, when necessary, a Fei Quanta 600 scanning electron microscope was used in low-vacuum mode (35 ×–2000 ×) to supplement and assist optical identification of wear traces, primarily polish and striations.

After the projectile penetration experiments, the shape of the perforated holes in UFG Al film was examined by using an FEI Quanta 600 scanning electron microscope operated at 10 kV. TEM analysis was performed on an FEI Tecnai F20 ST microscope operated at 200 kV to characterize the evolution of the microstructure near the impacted regions. To further probe the impact-induced microstructural changes in the UFG Al films, HRTEM experiments were performed.