D8 focus bragg brentano x ray powder diffractometer

Gas sorption measurements were conducted using a Micrometritics ASAP 2020 system. PXRD was carried out with a Bruker D8-Focus Bragg-Brentano X-ray powder diffractometer equipped with a Cu-sealed tube (λ = 1.54178 Å) at 40 kV and 40 mA. SC-XRD was measured on a Bruker Venture CMOS diffractometer equipped with a Cu-K_α sealed-tube X-ray source (λ = 1.54184 Å) or Mo-Kα sealed-tube X-ray source (λ = 0.71073 Å). NMR data were collected on a Mercury 300 MHz spectrometer. UV–Vis absorption spectra were recorded on a Shimadzu UV-2450 spectrophotometer. ICP-MS data were collected with a Perkin Elmer NexION^® 300D ICP-MS. TGA was conducted on a TGA-50 (SHIMADZU) thermogravimetric analyzer. Infrared (IR) measurements were performed on a SHIMADZU IR Affinity-1 spectrometer. Field-emission scanning electron microscopy images were collected on the FEI Quanta 600 field-emission scanning electron microscope (America) at 20 kV.

Elemental analyses of (C, H, N) were performed on a PE 2400 series II CHNS/O (PerkinElmer Instruments, Shelton, CT, USA) or an Elementar Vario EL-III analyzer (Elementar Analysensysteme GmbH, Hanau, Germany). Infrared spectra were obtained from a JASCO FT/IR-460 plus spectrometer with pressed KBr pellets (JASCO, Easton, MD, USA). Powder X-ray diffraction patterns were carried out with a Bruker D8-Focus Bragg–Brentano X-ray powder diffractometer equipped with a CuKα (λ_α = 1.54178 Å) sealed tube (Bruker Corporation, Karlsruhe, Germany). The UV-Vis spectrum was performed on a UV-2450 spectrophotometer (Dongguan Hongcheng Optical Products Co., Dongguan, China). Emission spectra were determined with a Hitachi F-4500 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). Energy dispersive X-ray (EDX) analysis was performed by using a JEOL JSM-7600F Ultra-High Resolution Schottky Field Emission Scanning Electron Microscope with Oxford Xmax80 energy dispersive X-ray spectrometer (JEOL, Ltd., Tokyo, Japan).