D max 2200 pc xrd system
The D/MAX-2200 PC XRD system is a versatile X-ray diffraction (XRD) instrument designed for laboratory analysis. It is capable of performing qualitative and quantitative phase analysis of powdered and solid samples. The system utilizes a Cu Kα X-ray source and can detect a wide range of materials, including ceramics, polymers, and metals. The D/MAX-2200 PC XRD system is equipped with a high-performance detector and advanced software for data acquisition and analysis.
3 protocols using d max 2200 pc xrd system
Characterization of MXene/RSF Hydrogels
Characterization of MXene Materials
(XRD) was measured by a Rigaku D/MAX-2200 PC XRD system (parameters:
Cu Kα radiation, λ = 1.54 Å, 40 mA, and 40 kV). The
micromorphology of Ti3C2 and Ti2C
MXenes were determined by FEI Magellan 400 field emission scanning
electron microscopy (FESEM). A JEM-2100F field emission source transmission
electron microscope (200 kV) provided the transmission electron microscopy
(TEM), high-resolution TEM (HRTEM), EDS, and selected area electron
diffraction (SAED) images. The Thermo Fisher Scientific ESCALAB 250
was used to get X-ray photoelectron spectroscopy (XPS).
Micro-Morphology Analysis of MXenes
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