Isv 469

Chlorophyll-a fluorescence of intact leaves was measured at 22°C using a Dual-PAM-100 instrument (Heinz Walz GmbH, Effeltrich, Germany). The maximum quantum efficiency of PSII photochemistry (F_V/F_M) and light-response curves of linear electron transport (ETRII) were measured on intact leaves after at least 30 min of dark adaptation. To calculate linear electron transport rates (ETRII), for each actinic light intensity, the PSII operating efficiency was multiplied with the corresponding photosynthetically active photon flux density, assuming an equal distribution of excitation energy between the two photosystems. The linear electron transport rates were corrected for the leaf absorbance measured with an integrating sphere (ISV-469, Jasco) attached to the Jasco V-550 spectrophotometer. Transmittance and reflectance spectra of leaves were recorded between 400 and 700 nm wavelength, and leaf absorbance was calculated as 100% minus transmittance of light through the leaf minus reflectance on the leaf surface. The average value of the absorbance spectrum between 400 and 700 nm was used for the calculation of linear electron flux, assuming an equal distribution of absorbed light between both photosystems.

Powder X-ray Diffraction (XRD) analysis was performed on a Philips X'PertMPD diffractometer (Cu-Ka = 0.15406 nm). The Brunauer-Emmett-Teller (BET) specific surface area (S_BET) was determined from N₂ adsorption-desorption isotherms at 196°C, in a Quantachrome Nova 4200e apparatus. Temperature programmed reduction (TPR) was carried out in an AMI-200 (Altamira Instruments) system. The H₂ consumption was followed by a thermal conductivity detector (TCD) and by a mass spectrometer (Dymaxion 200 amu, Ametek). Transmission electron microscopy (TEM) micrographs were obtained using a LEO 906E microscope operating with an accelerating voltage of 120 kV. Diffuse reflectance (DR) UV-Vis spectra of the powder samples were recorded on a JASCO V-560 UV-Vis spectrophotometer, equipped with an integrating sphere attachment (JASCO ISV-469). The reflectance spectra were converted by the instrument software (JASCO) to equivalent absorption Kubelka–Munk units. Steady-state photoluminescence (PL) spectra were recorded at room temperature on a JASCO FP-8300 spectrofluorometer equipped with a 150 W Xe lamp. The morphology and elemental mapping of the materials was obtained by SEM/EDXS analysis using a FEI Quanta 400FEG ESEM/EDAX Genesis X4M instrument.

The surface morphology and elemental composition of the HP-coated Ti substrates were examined using a field-emission scanning electron microscope (FE-SEM, Hitachi, SU-70) equipped with an energy-dispersive X-ray spectrometer (EDS). Steady-state absorption and emission spectra were obtained using an ultraviolet-visible (UV-vis) spectrophotometer (Hitachi, U-2800) and a spectrofluorometer (Hitachi, F-4500), respectively. For the plate sample, diffuse reflectance spectra were recorded using a diffuse reflectance UV-vis spectrophotometer (Jasco V-550) equipped with an integrating sphere (Jasco ISV-469). Infrared spectra were obtained using a FT-IR spectrometer (Perkin-Elmer 100). For IR measurements, about 100 samples were prepared and then the surfaces of these samples were scraped with knife. The scraped samples were collected in an agate mortar and then prepared in the form of pressed wafers (ca. 1% sample in KBr).