Ppp zeilr

Manufactured by Nanosensors

The PPP-ZEILR is a high-precision laboratory instrument designed for specialized applications. It functions as a precise measurement tool, but its detailed specifications and intended use are not available in this factual, unbiased description.

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Lab products found in correlation

5500 atomic force microscope, by Agilent Technologies (1 mentions) Hf2li, by Zurich Instruments (1 mentions)

2 protocols using ppp zeilr

Atomic Force Microscopy Surface Roughness Measurement

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Atomic force
microscopy (AFM) measurements were performed with a 5500 Atomic Force
Microscope (Agilent Technologies) using an arrowshaped cantilever
(PointProbe Plus ZEISS Veritekt Microscopes - Contact Mode Low Force
Constant - Reflex Coating (PPP-ZEILR), Nanosensors, tip diameter <
10 nm). All images were recorded in the intermittent contact mode
with constant force. The experiments were performed in a glovebox
with argon flow to minimize contact to air. An area of 5 μm
× 5 μm was chosen for all measurements. For data processing,
the software MountainsSPIP (Digital Surf/Image Metrology) was utilized.
The calculation of the arithmetic mean deviation of the surface roughness
(called average surface roughness, S_a,
for simplicity) was done according to EUR 15178N. The maximal surface
roughness (S_m) is the difference between
the highest and the lowest point on the sample surface within the
region of interest.

Wellmann J., Brinkmann J.P., Wankmiller B., Neuhaus K., Rodehorst U., Hansen M.R., Winter M, & Paillard E. (2021). Effective Solid Electrolyte Interphase Formation on Lithium Metal Anodes by Mechanochemical Modification. ACS Applied Materials & Interfaces, 13(29), 34227-34237.

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Atomic Force Microscopy Modifications

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We used a commercial AFM instrument (JEOL: JSPM 4200) after some modifications to the optics and electronics [37] . We used a digital lock-in amplifier (LIA) (Zurich Instruments: HF2LI) with PLL and multi-frequency (MF) options. The sample was directly glued on the top electrode of a lead zirconate titanate (PZT) piezoelectric actuator, which was fixed on a tube scanner. We used Si cantilevers (Nanosensors: PPP-ZEILR), whose spring constants (k z ) were calibrated using Sader's method [38] . The nominal tip radius was less than 10 nm.

Kimura K., Kobayashi K., Yao A, & Yamada H. (2016). Visualization of subsurface nanoparticles in a polymer matrix using resonance tracking atomic force acoustic microscopy and contact resonance spectroscopy. Nanotechnology, 27(41).

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