Vpfesem
The VPFESEM is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis. It features a field emission electron source and vacuum-compatible sample chamber, enabling high-resolution imaging and elemental analysis of a wide range of materials.
Lab products found in correlation
10 protocols using vpfesem
Physicochemical Characterization of Amino-Functionalized KIT-6 Silica
Visualizing Multispecies Biofilms by SEM
Comprehensive Membrane Characterization
Characterization of Nanostructured Materials
Comparative SEM Analysis of Transgenic Jute Fibers
Comprehensive Membrane Characterization Protocol
Scanning Electron Microscopy of FAMS
Characterization of Fabricated Scaffolds
by using a field emission scanning electron microscope (SIGMA VP FESEM,
ZEISS). The crystallinity of the scaffolds was tested by an X-ray
diffractometer (Rigaku, 007HF, Japan) with Cu Kα radiation (λ
= 1.54 Å) at room temperature at an angular range of 10–60°
in 2θ, in steps of 0.050°. Chemical compositional analysis
was conducted using a Fourier transform infrared (FT-IR) spectrophotometer
(Bruker VERTEX 70 FT-IR spectrophotometer, Germany) and a micro-Raman
spectrometer (LabRAM HR UV–vis NIR, Horiba) to record the FT-IR
and Raman spectra, respectively. Mechanical properties of the scaffolds
were assessed using a Universal Testing Machine (Tinius Olsen 5ST)
equipped with a 2.5 kN load cell at a crosshead rate of 1 mm/min and
a gauge length of 20 mm, following a standard ASTM D638 procedure.
Steady-state current–voltage (I–V) measurements were performed using a Keithley 2450 source
meter using a two-probe technique at a DC voltage sweep from −10
and +10 V at room temperature.
Nanomaterial Characterization for Biosensing
Characterization of BiOBr-Based Nanomaterials
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