Jsm it500lv

The surface morphologies and the shape and size of the microparticles were observed using a JSM-IT500LV scanning electron microscope (SEM) (Jeol, Tokyo, Japan) with SEM operational software. It has integrated energy dispersive spectroscopy, a W filament, and fully automatic gun alignment. Measurements were performed in low (101–103 Pa) vacuum mode, at a working distance of 10 mm, and an accelerated voltage of 10 kV, using a secondary electron detector (BED-S). The milled cigarette butt samples were placed on double-sided carbon tape.

Following exposure, the surface morphology of samples was first inspected and analyzed with a scanning electron microscope JEOL JSM-IT500LV with Aztec Live Advanced ULTIM 65 detector (Oxford Instruments, Abingdon, UK) equipped with energy dispersive spectroscopy (EDX) at accelerating voltage of 20 kV, to select the most appropriate and representative regions for Raman spectroscopy. Raman spectra were obtained using a Horiba Jobin Yvon LabRAM HR800 Raman spectrometer (Longjumeau, France) coupled to an Olympus BXFM optical microscope (Tokyo, Japan). The measurements were performed using a 633 nm laser excitation line, a 100× objective lens and a 600 grooves/mm grating with a spectral resolution of 2 cm⁻¹ per pixel. The power of the laser was set to 0.14 mW. A multi-channel air-cooled CCD detector was used, with integration times of between 20 and 30 s.